Zobrazeno 1 - 9
of 9
pro vyhledávání: '"José A. David Hernández De La Luz"'
Autor:
Gabriel Omar Mendoza Conde, José Alberto Luna López, Zaira Jocelyn Hernández Simón, José Álvaro David Hernández de la Luz, Karim Monfil Leyva, Jesús Carrillo López, Haydee Patricia Martínez Hernández, Erick Gastellóu Hernández, Dainet Berman Mendoza, Javier Flores Méndez
Publikováno v:
Nanomaterials, Vol 13, Iss 7, p 1271 (2023)
In this work, hybrid structures formed by nanostructured layers, which contain materials, such as porous silicon (PSi), carbon nanotubes (CNTs), graphene oxide (GO), and silicon-rich oxide (SRO), were studied. The PSi layers were obtained by electroc
Externí odkaz:
https://doaj.org/article/da0015ba32ae454aae24d4d8ab6ad4c6
Autor:
Erick AYALA-SÁNCHEZ, José Álvaro David HERNÁNDEZ-DE LA LUZ, Karim MONFIL-LEYVA, José Alberto LUNA-LÓPEZ
Publikováno v:
Journal of Scientific and Technical Applications. :1-15
Objectives: The present review work shows a detailed study of the optical and structural characteristics of SiOx films using different deposit techniques, among which employing the technique of Chemical Deposit in Vapor Phase by Hot Filament (HFCVD),
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9dcd0808e2da39595a05f6f4ed50c09a
https://doi.org/10.35429/jsta.2023.23.9.1.15
https://doi.org/10.35429/jsta.2023.23.9.1.15
Autor:
Gabriel Omar Mendoza Conde, José Alberto Luna López, Zaira Jocelyn Hernández Simón, José Álvaro David Hernández de la Luz, Godofredo García Salgado, Erick Gastellou Hernández, Haydee Patricia Martínez Hernández, Javier Flores Méndez
Publikováno v:
Sensors, Vol 22, Iss 10, p 3904 (2022)
MIS-type structures composed of silicon-rich oxide (SRO), thin films deposited by hot filament chemical vapor deposition (HFCVD), show interesting I-V and I-t properties under white light illumination and a response as photodetectors. From electrical
Externí odkaz:
https://doaj.org/article/8798c41f7cbf41c586f2472be24d9e4e
Autor:
Lara, Anayantzi Luna Zempoalteca, José Álvaro David Hernández de la Luz, Adan Luna Flores, José Alberto Luna López, Alfredo Benítez
Publikováno v:
Materials; Volume 16; Issue 12; Pages: 4357
In this work, we report how manganese phthalocyanine (MnPc) films obtained using the ultrasonic spray–pyrolysis technique at 40 °C deposited on glass substrate subjected to thermal annealing at 100 °C and 120 °C. The MnPc films were characterize
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::ca522ed88ee82e1c357c358935dac564
Autor:
Haydee Patricia Martínez Hernández, José Alberto Luna López, José Álvaro David Hernández de la Luz, Adan Luna Flores, Karim Monfil Leyva, Godofredo García Salgado, Jesús Carrillo López, Rafael Ordoñez Flores, Sergio Alfonso Pérez García, Zaira Jocelyn Hernández Simón, Gabriel Omar Mendoza Conde, Raquel Ramírez Amador
Publikováno v:
Crystals, Vol 10, Iss 2, p 127 (2020)
This work is focused on making a correlation between results obtained by using spectroscopy and microscopy techniques from single and twofold-layer Silicon-Rich Oxide (SRO) films. SRO films single-layer and twofold-layer characterizations were compar
Externí odkaz:
https://doaj.org/article/926c340c7dde4318a2ec5137426af749
Autor:
Zaira J. Hernández Simón, José A. Luna López, José A. David Hernández De La Luz, Gabriel O. Mendoza Conde, Karim Monfil Leyva, Oscar Raymond Herrera, Mario Moreno Moreno, Haydee P. Martínez Hernández, Eduardo Flores
Publikováno v:
Journal of Alloys and Compounds. 955:170215
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f0f215dca821b98a4bcb4c404963a770
https://doi.org/10.1016/j.jallcom.2023.170215
https://doi.org/10.1016/j.jallcom.2023.170215
Autor:
José Álvaro David Hernández de la Luz, José Federico Casco-Vásquez, Haydee P. Martinez-Hernandez, Jose A. Luna-Lopez
Publikováno v:
Revista de Ingeniería Eléctrica. :10-15
This paper presents the results obtained by the electrooptical characterization of a MIS structure built by depositing a film of an Indium Tin Oxide (ITO) on a Silicon Rich Oxide (SRO) film using the Chemical Vapor Deposition Hot Filament (HFCVD) sys
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5248a0812080c9fd250f89ca652e84b
https://doi.org/10.35429/jee.2020.12.4.10.15
https://doi.org/10.35429/jee.2020.12.4.10.15
Autor:
José Álvaro David Hernández de la Luz, Nora Castillo-Tépox, Karim Monfil-Leyva, Jose A. Luna-Lopez
Publikováno v:
Revista de Simulación y Laboratorio. :9-14
In this work we present the results of the analysis obtained from the deposit and characterization of thin films of silicon rich oxide (SRO). The films were obtained by hot filament chemical vapor deposition (HFCVD) technique, such films were deposit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a12827db624a78adc97944e37071d973
https://doi.org/10.35429/jsl.2019.20.6.9.14
https://doi.org/10.35429/jsl.2019.20.6.9.14
Autor:
José Alberto Luna López, José Álvaro David Hernández de la Luz, Haydee Patricia Martínez Hernández, Rafael Ordonez Flores, Gabriel Omar Mendoza Conde, Karim Monfil Leyva, Godofredo Garcia Salgado, Jesús Carrillo López, Zaira Jocelyn Hernández Simón, Raquel Ramírez Amador, Sergio Alfonso Pérez García, Adan Luna Flores
Publikováno v:
Crystals, Vol 10, Iss 2, p 127 (2020)
Crystals
Volume 10
Issue 2
Crystals
Volume 10
Issue 2
This work is focused on making a correlation between results obtained by using spectroscopy and microscopy techniques from single and twofold-layer Silicon-Rich Oxide (SRO) films. SRO films single-layer and twofold-layer characterizations were compar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc00f951e620e202d6c024db9b0aad37
https://www.mdpi.com/2073-4352/10/2/127
https://www.mdpi.com/2073-4352/10/2/127