Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Jordan R. Keuseman"'
Publikováno v:
2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b29e030e000274a50a4480d6a1f78c83
https://doi.org/10.1109/epeps53828.2022.9947165
https://doi.org/10.1109/epeps53828.2022.9947165
Autor:
Barry K. Gilbert, Chad M. Smutzer, Clifton R. Haider, Jordan R. Keuseman, Christopher K. White
Publikováno v:
2021 IEEE 30th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cbda441340bddd422f341e82eefa2f7
https://doi.org/10.1109/epeps51341.2021.9609134
https://doi.org/10.1109/epeps51341.2021.9609134
Autor:
Jordan R. Keuseman, Clifton R. Haider, Barry K. Gilbert, Tim Daun-Lindberg, Christopher K. White
Publikováno v:
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
Voltage regulator impedance characterization is a straightforward concept but the challenges in making high-fidelity measurements are numerous as the impedance becomes progressively smaller. This paper evaluates techniques used for low impedance buck
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74b8ce9c48af4f1b3f58a72abab53913
https://doi.org/10.1109/emcsi38923.2020.9191556
https://doi.org/10.1109/emcsi38923.2020.9191556