Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Jordan Merkel"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 525-534 (2018)
A 10.5 nm silicon doped HfO2 film is deposited and examined on three different bottom electrodes: a TiN electrode such as would be found in capacitive FeRAM, a lightly doped p-Si substrate as would be present in an FeFET, and an n+ Si electrode. The
Externí odkaz:
https://doaj.org/article/15c3ce0ad74a4a03adb224c7df57c2dc
Autor:
Jerome T. Mlack, Nick Edwards, Brian Novak, Annaliese Drechsler, Jordan Merkel, Timothy Vasen, Daniel J. Hannan, Paul Brabant, Ishan Wathuthanthri, Justin Parke, Sam Wanis, Robert S. Howell, Ken A. Nagamatsu
Publikováno v:
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Autor:
Shamima Afroz, Eric J. Stewart, Sara Taylor, Josephine B. Chang, Robert S. Howell, Ken Nagamatsu, Kevin Frey, Shalini Gupta, Sarat Saluru, Jordan Merkel
Publikováno v:
IEEE Electron Device Letters. 40:1048-1051
We report on the super-lattice castellated field-effect transistor (SLCFET) device architecture whose unique geometry enables new scaling and optimization strategies for RF power and performance. Measured transistor values show excellent potential fo
Autor:
Mark Yu, Justin Parke, Brian Novak, Ken Nagamatsu, Robert S. Howell, Sourabh Khandelwal, Jordan Merkel, Patrick B. Shea
Publikováno v:
BCICTS
Accurate compact model for simulating radiofrequency (RF) switch characteristics of a Super Lattice Castellated Field Effect Transistor (SLCFET) is presented. The new model is developed by modifying the industry standard ASM-HEMT compact model formul
Autor:
Robert S. Howell, Jordan Merkel, Shamima Afroz, Josephine B. Chang, Ken Nagamatsu, Brian Novak
Publikováno v:
2020 IEEE/MTT-S International Microwave Symposium (IMS).
Efficient, high power density RF signal amplification is a driving enabler for future RF systems. The Super-Lattice Castellated Field Effect Transistor (SLCFET) leverages a GaN-based superlattice to support multiple stacked 2D-Electron Gas (2DEG) lay
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 525-534 (2018)
A 10.5 nm silicon doped HfO2 film is deposited and examined on three different bottom electrodes: a TiN electrode such as would be found in capacitive FeRAM, a lightly doped p-Si substrate as would be present in an FeFET, and an n+ Si electrode. The