Zobrazeno 1 - 10
of 17
pro vyhledávání: '"JoonSeo Yim"'
Autor:
Hyuncheol Kim, Yun Hyeok Kim, Sanghyuck Moon, Hwanwoong Kim, Byeongjun Yoo, Jueun Park, Seyoung Kim, June-Mo Koo, Sewon Seo, Hye Ji Shin, Younghwan Choi, Jinwoo Kim, Kyungil Kim, Jae-Hoon Seo, Seunghyun Lim, Taesub Jung, Howoo Park, Sangil Jung, Juhyun Ko, Kyungho Lee, JungChak Ahn, JoonSeo Yim
Publikováno v:
2023 IEEE International Solid- State Circuits Conference (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::504cff831019577288b5279490c45108
https://doi.org/10.1109/isscc42615.2023.10067732
https://doi.org/10.1109/isscc42615.2023.10067732
Autor:
Youngsun Oh, Jungwook Lim, Soeun Park, Dongsuk Yoo, Moosup Lim, Joongseok Park, Seojoo Kim, Minwook Jung, Sungkwan Kim, Junetaeg Lee, In-Gyu Baek, Kwangyul Ryu, Kyungmin Kim, Youngtae Jang, Min-Sun Keel, Gyujin Bae, Seunghun Yoo, Youngkyun Jeong, Bumsuk Kim, Jungchak Ahn, Haechang Lee, Joonseo Yim
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e3e9bf537be6914997706449eda5171
https://doi.org/10.1109/iedm45625.2022.10019558
https://doi.org/10.1109/iedm45625.2022.10019558
Autor:
Hye Yeon Park, Yunki Lee, Jonghoon Park, Hyunseok Song, Taesung Lee, Hyung Keun Gweon, Yunji Jung, Jeongmin Bae, Boseong Kim, Junwon Han, Seungwon Kim, Cheolsang Yoon, Jeongki Kim, Changkeun Lee, Sehoon Yoo, EuiYeol Kim, Hyunmin Baek, Howoo Park, Bumsuk Kim, JungChak Ahn, JoonSeo Yim
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05de7957c725474fbb05a4415453f4f2
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830428
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830428
Autor:
Jungbin Yun, Seungjoon Lee, Seungwon Cha, Jihun Kim, Jeongho Lee, Hanseok Kim, Eungkyu Lee, Seonok Kim, Seunghan Hong, Hyungchae Kim, Jinsuk Huh, Sungchul Kim, Kazunori Kakehi, Jae-Ho Kim, June-Mo Koo, Eunsang Cho, Heegeun Jeong, Howoo Park, Kyungho Lee, JungChak Ahn, JoonSeo Yim
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f57d4130d8a5a2514cba59dfe1550fc4
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830254
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830254
Publikováno v:
Electronic Imaging. 34:343-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6d7fb57289c1e1d4e3dabf18ac5bead
https://doi.org/10.2352/ei.2022.34.9.iqsp-343
https://doi.org/10.2352/ei.2022.34.9.iqsp-343
Publikováno v:
Electronic Imaging. 34:341-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7369c31e1373ecdb8bf2cb47f7ecc32
https://doi.org/10.2352/ei.2022.34.9.iqsp-341
https://doi.org/10.2352/ei.2022.34.9.iqsp-341
Autor:
Sungho Cha, Suhyun Cho, Daeil Yu, Minhyuk Lee, Kaeul Lee, Byoungho Gong, Sang-Woo Lee, Sung-Su Kim, Joonseo Yim
Publikováno v:
Electronic Imaging. 34:195-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::169ef1b9048a0f718c84ef8040d34c38
https://doi.org/10.2352/ei.2022.34.9.iqsp-195
https://doi.org/10.2352/ei.2022.34.9.iqsp-195
Publikováno v:
Electronic Imaging. 34:342-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2c864e931806313720ada8188218f8b
https://doi.org/10.2352/ei.2022.34.9.iqsp-342
https://doi.org/10.2352/ei.2022.34.9.iqsp-342