Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Joo, Won Don"'
Autor:
Maxim Ryabko, Vladimir O. Bessonov, Anton Medvedev, Sangwoo Bae, Alexander S. Shorokhov, Hosun Yoo, Taehyun Kim, Joo Won-Don, Kyunghun Han, Stanislav Polonsky, Ingi Kim, Boris I. Afinogenov, Minhwan Seo, Vladimir N. Mantsevich, I. M. Antropov, Andrey A. Fedyanin, Nikita R. Filatov, Jeang Eun-Hee, Anton N. Sofronov, Natalia Sergeevna Maslova
Publikováno v:
Optics letters. 46(13)
We report the experimental observation of the UV-visible upconverted luminescence of bulk silicon under pulsed infrared excitation. We demonstrate that non-stationary distribution of excited carriers leads to the emission at spectral bands never to o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fe6f04935ad7ba50ffab8739d66d1d43
https://pubmed.ncbi.nlm.nih.gov/34197383
https://pubmed.ncbi.nlm.nih.gov/34197383
Autor:
Boris I. Afinogenov, Seulgi Lee, Lee Sang-Min, Sangwoo Bae, Nikita R. Filatov, Anton N. Sofronov, Minhwan Seo, Maxim Ryabko, Anton Medvedev, Vladimir O. Bessonov, Jeang Eun-Hee, Taehyun Kim, Aleksander S. Shorokhov, I. M. Antropov, Akinori Ohkubo, Ingi Kim, Joo Won-Don
Publikováno v:
Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII.
We demonstrate the broadband visible luminescence from bulk crystalline silicon and silicon nanoparticles sized 100- 30 nm under near-infrared excitation. We show that the luminescence spectrum has two distinct peaks. The first being centered at 550
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8550dfac14fe9afdb58c5e1c28691078
https://doi.org/10.1117/12.2570415
https://doi.org/10.1117/12.2570415
Autor:
Sangwoo Bae, Woo-Cheol Jeong, Sunghwi Cho, Minhwan Seo, Park Hun-Yong, Jiyoung Chu, Joo Won-Don
Publikováno v:
Laser Beam Shaping XX.
We present a novel optical device which interchanges two orthogonal directions in the cross-section of a beam. The optical prism is composed of six flat faces and has particular edge angles. The beam passing through the component is totally reflected
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9cee43b86c2d40f4f6c0537c1fa56891
https://doi.org/10.1117/12.2567965
https://doi.org/10.1117/12.2567965
Publikováno v:
Reflection, Scattering, and Diffraction from Surfaces VII.
Advances in the semiconductor industry have led the wafer inspection technology to the limit of nanometer-scale defect detection, which is far beyond the diffraction limit. In this regime, the signal-to-noise ratio (SNR) is the figure-of-merit to det
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57a463c7d30769deb5cb6caf44f1b29d
https://doi.org/10.1117/12.2567116
https://doi.org/10.1117/12.2567116
Autor:
Seulgi Lee, I. M. Antropov, Sangwoo Bae, Akinori Ohkubo, Joo Won-Don, Aleksandr Shorokhov, Hosun Yoo, Anton Medvedev, Kyunghun Han, Taehyun Kim, Minhwan Seo, Boris I. Afinogenov, Jeang Eun-Hee, Vladimir O. Bessonov, Maksim Riabko, Lee Sang-Min, Anton N. Sofronov, Ingi Kim
Publikováno v:
Nonlinear Optics and its Applications 2020.
Detection of a single nanoparticle on a bare silicon wafer has been a challenge in the semiconductor industry for decades. Currently, the most successful and widely used technique is dark-field microscopy. However, it is not capable of detecting sing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c80a3e9c9e77b99a15747edc787cee0
https://doi.org/10.1117/12.2552708
https://doi.org/10.1117/12.2552708
Autor:
Jungchul Lee, Seongkeun Cho, Hyungu Kim, Seulgi Lee, Joo Won-Don, Janghwi Lee, Sangwoo Bae, Taehyun Kim, Akinori Ohkubo
Publikováno v:
Optics letters. 43(23)
We rediscover the null ellipsometry principle for an outstanding image-contrast enhancement method for darkfield imaging. Simply by adding polarizers, compensators, and a photodiode sensor to a conventional darkfield imaging system and applying the n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cbc03f78ccb5f5e1ddd766107e26ba4d
https://pubmed.ncbi.nlm.nih.gov/30499972
https://pubmed.ncbi.nlm.nih.gov/30499972
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Sasián, José, Youngworth, Richard N., Chu, Jiyoung, Cho, Sungwhi, Joo, Won Don, Jang, Sangdon
Publikováno v:
Proceedings of SPIE; August 2017, Vol. 10377 Issue: 1 p103770L-103770L-8, 933939p
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.