Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Jonny Ingman"'
Autor:
Natalia I. Kanko, Samu K. Jarvinen, Tommi J. Karkkainen, Joni Jormanainen, Pertti Silventoinen, Jonny Ingman, Aleksi Vulli, Joonas A. R. Leppanen, Juuso Rautio, Janne Jappinen
Publikováno v:
IEEE Access, Vol 9, Pp 133795-133808 (2021)
In this article, a non-destructive method is presented, using 2D X-ray imaging, to investigate corrosion defects in thick film resistors stressed by two different corrosion experiments, a single gas experiment and a flowers of sulphur experiment. In
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ce7298b994c48b8994ec774218aaf461
https://doi.org/10.1109/access.2021.3116282
https://doi.org/10.1109/access.2021.3116282
Publikováno v:
Microelectronics Reliability. 64:352-356
A non-destructive method using X-ray imaging to find cracks in multilayer ceramic capacitors (MLCCs) mounted in different orientations with respect to the bending direction is presented. In total 300 MLCCs were investigated by 2D and 3D X-ray imaging
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::862c3e93f7a7b2e43b9871fdfa2d5c8b
https://doi.org/10.1016/j.microrel.2016.07.110
https://doi.org/10.1016/j.microrel.2016.07.110
Localization of dielectric breakdown defects in multilayer ceramic capacitors using 3D X-ray imaging
Autor:
Jimmy Ingman, Joni Jormanainen, Tommi J. Karkkainen, Kari Maula, Jonny Ingman, Pertti Silventoinen, Aleksi Vulli
In this article, a non-destructive method using 3D X-ray imaging to find dielectric breakdowndefects in multilayer ceramic capacitors (MLCCs) aged by high temperature and high voltage in an accelerated test is presented. In total, 64 aged samples wer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9f48bc0a27f3440cfff62293b2c939c
http://lutpub.lut.fi/handle/10024/158789
http://lutpub.lut.fi/handle/10024/158789
