Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Jong-Hak Baek"'
Autor:
Jong Hak Baek
Publikováno v:
Tae Dong Institute of classic research. 46:291-308
Publikováno v:
IEEE Journal of Solid-State Circuits. 55:805-816
This article proposes a physical unclonable function (PUF) based on the contact formation probability. The contact here is the interconnect layer between the metal and the silicon in a chip. As the contact is designed smaller than the size given in t
Publikováno v:
DSD
This paper compares two types of physical unclonable function (PUF) circuits in terms of reliability, mismatch-based PUF vs. physical-based PUF. Most previous PUF circuits utilize device mismatches for generating random responses. Although they have
Autor:
Lee Jae-Hoon, Jong Hak Baek, Ho Kyoon Chung, Chang Ju Lee, Hong Kwon Kim, Jin-Tae Kim, Myunghee Lee, Chang Sik Choi, Tae-Jin Kim, Han Su Pae
Publikováno v:
IEEE Journal of Solid-State Circuits. 41:2974-2982
A display driver IC based on a current-sink driving scheme has been developed for QVGA (240times320), low-temperature poly-silicon (LTPS) active matrix organic light-emitting diodes (AMOLEDs) displays. The current-mode driver IC consists of a source
Autor:
Jong Kang Park, Junchul Park, Yoon Kyung Choi, Chang-Ju Lee, Hosuk Na, San-ho Byun, Myunghee Lee, Sang-Woo Kim, Joo-Hyeon Lee, Gyoo-Cheol Hwang, Shin Yeon-Joong, Ki-Duk Kim, Hyung-Dal Kwon, Yong-Yeob Choi, Hae-Yong Ahn, Hwa-Hyun Cho, Kyung-Suk Jang, Jong-Hak Baek, Min-Soo Cho
Publikováno v:
ISSCC
Capacitive touch screens have become widely adopted in mobile applications. Capacitive touch-screen display modules have conventionally been assembled by bonding two separate modules: 1) a touch-screen module with touch panel glass or film attached t
Autor:
Chang Ju Lee, Ho Kyoon Chung, Jin-Tae Kim, Han Su Pae, Hong Kwon Kim, Chang-Sik Choi, Lee Jae-Hoon, Tae-Jin Kim, Jong Hak Baek, Jong-Seon Kim, Myunghee Lee
Publikováno v:
ISSCC
A current driver with 720 outputs for active-matrix organic LEDs uses a current-copier scheme to produce 64 gray levels with maximum 2% error from 10nA to 10uA on a 19.2 times 17.8mm2 die
Autor:
Jong Hak Baek, Jae Hoon Lee, Han Su Pae, Chang Ju Lee, JongSeon Kim, Myunghee Lee, JinTae Kim, ChangSik Choi, Hong Kwon Kim, Tae Jin Kim, Ho Kyoon Chung
Publikováno v:
2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers; 2006, p609-618, 10p
Autor:
Jong Hak Baek, Myunghee Lee, Jae Hoon Lee, Han Su Pae, Chang Ju Lee, Jin Tae Kim, Choi, Chang Sik, Hong Kwon Kim, Tae Jin Kim, Ho Kyoon Chung
Publikováno v:
IEEE Journal of Solid-State Circuits; Dec2006, Vol. 41 Issue 12, p2974-2982, 9p, 10 Diagrams, 1 Chart, 1 Graph