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pro vyhledávání: '"Jones, Lewys"'
In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiments are becoming more widely available. As the practicable scan speed of
Externí odkaz:
http://arxiv.org/abs/2405.06367
Autor:
Maity, Nikhilesh, Haddad, Milan, Bassiri-Gharb, Nazanin, Kumar, Amit, Jones, Lewys, Lisenkov, Sergey, Ponomareva, Inna
Size-driven transition of an antiferroelectric into a polar ferroelectric or ferrielectric state is a strongly debated issue from both experimental and theoretical perspectives. While critical thickness limits for such transitions have been explored,
Externí odkaz:
http://arxiv.org/abs/2402.14176
Autor:
Gabbett, Cian, Doolan, Luke, Synnatschke, Kevin, Gambini, Laura, Coleman, Emmet, Kelly, Adam G., Liu, Shixin, Caffrey, Eoin, Munuera, Jose, Murphy, Catriona, Sanvito, Stefano, Jones, Lewys, Coleman, Jonathan N.
Networks of solution-processed nanomaterials are important for multiple applications in electronics, sensing and energy storage/generation. While it is known that network morphology plays a dominant role in determining the physical properties of prin
Externí odkaz:
http://arxiv.org/abs/2301.11046
Autor:
Mullarkey, Tiarnan, Geever, Matthew, Peters, Jonathan J. P., Griffiths, Ian, Nellist, Peter D., Jones, Lewys
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous works have previously highlighted and contrasted performance of various
Externí odkaz:
http://arxiv.org/abs/2212.04050
Autor:
McBean, Patrick, Milne, Zachary, Kanthawar, Arjun, O'Byrne, Cameron, Hattar, Khalid, Jones, Lewys
The transmission electron microscope (TEM) has become an essential tool for innovation in nanoscience, material science, and biology. Despite these instruments being widely used across both industry and academia, academics may hesitate to propose sub
Externí odkaz:
http://arxiv.org/abs/2212.02966
Low voltage scanning electron microscopy is a powerful tool for examining surface features and imaging beam sensitive materials. Improving resolution during low voltage imaging is then an important area of development. Decreasing the effect of chroma
Externí odkaz:
http://arxiv.org/abs/2212.02964
Autor:
Nordahl, Gregory, Jones, Lewys, Christiansen, Emil Frang, Hunnestad, Kasper Aas, Nord, Magnus
Precession electron diffraction has in the past few decades become a powerful technique for structure solving, strain analysis, and orientation mapping, to name a few. One of the benefits of precessing the electron beam, is increased reciprocal space
Externí odkaz:
http://arxiv.org/abs/2211.11413
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appearance of scan distortions. Whilst several strategies exist for increasi
Externí odkaz:
http://arxiv.org/abs/2211.06954
Autor:
Kusumi, Taichi, Katakami, Shun, Ishikawa, Ryo, Kawahara, Kazuaki, Mullarkey, Tiarnan, Bekkevold, Julie Marie, Peters, Jonathan J.P., Jones, Lewys, Shibata, Naoya, Okada, Masato
Publikováno v:
In Ultramicroscopy October 2024 264
Autor:
Peters, Jonathan J.P., Mullarkey, Tiarnan, Bekkevold, Julie Marie, Geever, Matthew, Ishikawa, Ryo, Shibata, Naoya, Jones, Lewys
Publikováno v:
In Ultramicroscopy December 2024 267