Digital autofocusing of a coded-aperture Laue diffraction microscope

Autor: Doğa Gürsoy, Dina Sheyfer, Michael Wojcik, Wenjun Liu, Jonathan Z. Tischler

To provide optimal depth resolution with a coded-aperture Laue diffraction microscope, an accurate position of the coded-aperture and its scanning geometry need to be known. However, finding the geometry by trial and error is a time-consuming and oft

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5d39f7a33ce066c3f32b06adbb38fe7
http://arxiv.org/abs/2208.07873

Experimental setup combining in situ hard X-ray photoelectron spectroscopy and real-time surface X-ray diffraction for characterizing atomic and electronic structure evolution during complex oxide heterostructure growth

Autor: Jonathan Z. Tischler, Dillon D. Fong, Christopher M. Rouleau, Erika Benda, Gyula Eres, Qiyang Lu, Zhizhi Zhang, Ho Nyung Lee

Publikováno v: The Review of scientific instruments. 90(9)

We describe the next-generation system for in situ characterization of a complex oxide thin film and heterostructure growth by pulsed laser deposition (PLD) using synchrotron hard X-rays. The system consists of a PLD chamber mounted on a diffractomet

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e9ace798a0010bd28987e622b322a29
https://pubmed.ncbi.nlm.nih.gov/31575256

Synchrotron X-ray microbeam diffraction measurements of full elastic long range internal strain and stress tensors in commercial-purity aluminum processed by multiple passes of equal-channel angular pressing

Autor: Ruqing Xu, Thien Q. Phan, Terence G. Langdon, I-Fang Lee, Lyle E. Levine, Jonathan Z. Tischler, Michael E. Kassner, Yi Huang

Publikováno v: Acta Materialia. 112:231-241

Synchrotron X-ray microbeam diffraction was used to measure the full elastic long range internal strain and stress tensors of low dislocation density regions within the submicrometer grain/subgrain structure of equal-channel angular pressed (ECAP) al

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cf2a7127c0ba3d4c9b3914ca26b91780
https://doi.org/10.1016/j.actamat.2016.04.035

A statistical analysis of the elastic distortion and dislocation density fields in deformed crystals

Autor: Anter El-Azab, Jonathan Z. Tischler, Mamdouh S. Mohamed, Bennett C. Larson

Publikováno v: Journal of the Mechanics and Physics of Solids. 82:32-47

The statistical properties of the elastic distortion fields of dislocations in deforming crystals are investigated using the method of discrete dislocation dynamics to simulate dislocation structures and dislocation density evolution under tensile lo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1142233bd6bf57d5a9bca1e6b4b922e

Boundary migration in a 3D deformed microstructure inside an opaque sample

Autor: R. Xu, Eric R. Homer, Jonathan Z. Tischler, Andrew Godfrey, Wing Kam Liu, Yubin Zhang, D. Juul Jensen, John D. Budai

Publikováno v: Scientific Reports
Scientific Reports, Vol 7, Iss 1, Pp 1-8 (2017)
Zhang, Y, Budai, J D, Tischler, J Z, Liu, W, Xu, R, Homer, E R, Godfrey, A & Juul Jensen, D 2017, ' Boundary migration in a 3D deformed microstructure inside an opaque sample ', Scientific Reports, vol. 7, no. 1, 4423 . https://doi.org/10.1038/s41598-017-04087-9

How boundaries surrounding recrystallization grains migrate through the 3D network of dislocation boundaries in deformed crystalline materials is unknown and critical for the resulting recrystallized crystalline materials. Using X-ray Laue diffractio

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7936b2c25fc05c87b948c8b9cdf3439
http://europepmc.org/articles/PMC5493684