Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Jonathan W. Wittwer"'
Autor:
Alex David Corwin, Steve Winzer, Danelle M. Tanner, Jonathan W. Wittwer, Ted B. Parson, Brad L. Boyce, Jeremy A. Walraven
Publikováno v:
Microelectronics Reliability. 47:1806-1811
In cases where device numbers are limited, large statistical studies to verify reliability are impractical. Instead, an approach incorporating a solid base of modelling, simulation, and material science into a standard reliability methodology makes m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7c4cc1f3a701b755ab703926f5bdf00
https://doi.org/10.1016/j.microrel.2007.07.061
https://doi.org/10.1016/j.microrel.2007.07.061
Publikováno v:
Journal of Micromechanics and Microengineering. 16:943-950
The objective of this work is to demonstrate the feasibility of on-chip sensing of bistable mechanism state using the piezoresistive properties of polysilicon, thus eliminating the need for electrical contacts. Changes in position are detected by obs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66fb302c7ef83a2ba11cd8b634c022ce
https://doi.org/10.1088/0960-1317/16/5/010
https://doi.org/10.1088/0960-1317/16/5/010
Publikováno v:
Journal of Microelectromechanical Systems. 15:33-41
Although the use of compliance or elastic flexibility in microelectromechanical systems (MEMS) helps eliminate friction, wear, and backlash, compliant MEMS are known to be sensitive to variations in material properties and feature geometry, resulting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::769cb75415e530d22d5a06559c25efd2
https://doi.org/10.1109/jmems.2005.859190
https://doi.org/10.1109/jmems.2005.859190
Autor:
Jonathan W. Wittwer, Larry L. Howell
Publikováno v:
Journal of Applied Mechanics. 71:748-751
Local distortion at the built-in ends of cantilever beams can lead to significant errors when models assume the support to be perfectly rigid. This paper presents a novel approach for mitigating this effect, using appropriately sized fillets to provi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ecee30893e7c7e55e71b7749731b90d
https://doi.org/10.1115/1.1782913
https://doi.org/10.1115/1.1782913
Publikováno v:
Mechanism and Machine Theory. 39:681-693
This paper demonstrates the direct linearization method (DLM) applied to position error in kinematic linkages due to link-length and angle variations. It combines the mathematical techniques used in assembly tolerance analysis and kinematic error ana
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07ca9855a46d5757dd1f279af7258ce9
https://doi.org/10.1016/j.mechmachtheory.2004.01.001
https://doi.org/10.1016/j.mechmachtheory.2004.01.001
Publikováno v:
Journal of Micromechanics and Microengineering. 12:13-20
Surface micromachining of micro-electro-mechanical systems (MEMS), like all other fabrication processes, has inherent variation that leads to uncertain material and dimensional parameters. By considering the effects of these variations during the des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd6c36ce4ec96fdd6afee78d34735127
https://doi.org/10.1088/0960-1317/12/1/303
https://doi.org/10.1088/0960-1317/12/1/303
Autor:
Gregory N. Nielson, Paul J. Resnick, Leslie M. Phinney, David S. Epp, Uma Krishnamoorthy, Vipin P. Gupta, Jonathan W. Wittwer
Publikováno v:
Volume 12: Micro and Nano Systems, Parts A and B.
We have developed and demonstrated a technique for optical excitation of mechanical resonance that does not require coherent, monochromatic, or time-varying light. Previous methods for optically exciting mechanical motion in microscale devices requir
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31439e1c1d11778085b9a70df0ec9036
https://doi.org/10.1115/imece2009-12980
https://doi.org/10.1115/imece2009-12980
Autor:
John Anthony Mitchell, Matthew R. W. Brake, Jeremy A. Walraven, David S. Epp, Michael S. Baker, Jonathan W. Wittwer, Rebecca C. Clemens
This report summarizes design and modeling activities for the MEMS passive shock sensor. It provides a description of past design revisions, including the purposes and major differences between design revisions but with a focus on Revisions 4 through
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d788d81b38c60b95bf6cddb6a5170464
https://doi.org/10.2172/945193
https://doi.org/10.2172/945193
Autor:
Matthew R. W. Brake, Michael S. Baker, John Anthony Mitchell, Jill Blecke, Jeremy A. Walraven, David S. Epp, Rebecca C. Clemens, Jonathan W. Wittwer
This report summarizes the functional, model validation, and technology readiness testing of the Sandia MEMS Passive Shock Sensor in FY08. Functional testing of a large number of revision 4 parts showed robust and consistent performance. Model valida
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03cc5adf5fdcf70b54b67a701fce4f19
https://doi.org/10.2172/943322
https://doi.org/10.2172/943322
Autor:
Jack E. Houston, Jonathan W. Wittwer, Michael S. Baker, Rebecca C. Clemens, Douglas A. Crowson, John Anthony Mitchell, Jeremy A. Walraven, David S. Epp, Jill Blecke
This report describes activities conducted in FY07 to mature the MEMS passive shock sensor. The first chapter of the report provides motivation and background on activities that are described in detail in later chapters. The second chapter discusses
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::349b5df0d73a7358789a56176b4c0ff7
https://doi.org/10.2172/940529
https://doi.org/10.2172/940529