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pro vyhledávání: '"Jonathan R. Ahlbin"'
Publikováno v:
IEEE Transactions on Nuclear Science. 64:637-642
Single-event transients (SETs) induced by alpha particles and heavy ions are measured and analyzed with subthreshold voltage SET characterization circuits. Using a Schmitt trigger inverter target chain fabricated in a 65-nm bulk CMOS process, SET pul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7fcad4350fff390bc8ec04de812f56cd
https://doi.org/10.1109/tns.2016.2629448
https://doi.org/10.1109/tns.2016.2629448
