Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Jonathan D. P. Counsell"'
Autor:
Edward Walton, Apurva Mehta, Peer Decker, Jonathan D. P. Counsell, Alfred Ludwig, Huilong Hou, Sigurd Thienhaus, Ichiro Takeuchi, Naila Al Hasan, Suchismita Sarker, Tieren Gao
Publikováno v:
ACS Combinatorial Science. 22:641-648
Combinatorial synthesis and high-throughput characterization of a Ni-Ti-Co thin film materials library are reported for exploration of reversible martensitic transformation. The library was prepared by magnetron co-sputtering, annealed in vacuum at 5
Autor:
Jonathan D. P. Counsell, Emily F. Smith, David J. H. Cant, Alexander G. Shard, Xiaoling Zhang, Christopher J. Blomfield, Parnia Navabpour
Publikováno v:
Surface and Interface Analysis. 51:763-773
This paper provides a description of the transmission function of an XPS instrument operating with exchangeable Al Kα (1486.6 eV) and Ag Lα (2984.3 eV) sources. Both sources use the same quartz crystal monochromator and illuminate the same area of
Publikováno v:
Surface Science Spectra. 29:014009
Autor:
Jonathan D. P. Counsell, Alex G. Shard, David J. Cant, Christopher J. Blomfield, Parnia Navabpour, Xiaoling Zhang
Publikováno v:
Surface Science Spectra. 28:024005
Publikováno v:
Surface Science Spectra. 28:024007
Publikováno v:
Surface Science Spectra. 28:024004
XPS spectra of five first row transition metals (Fe, Co, Ni, Cu, and Zn) were obtained using monochromatic Ag Lα radiation. Survey and high resolution photoelectron region (2p, 2s, 3p, and 3s) and x-ray induced Auger spectra were recorded from Ar+ i
Publikováno v:
Microscopy and Microanalysis. 27:3448-3448
Autor:
Morgan R. Alexander, Jonathan D. P. Counsell, James S. Sharp, James Bailey, Alexander G. Shard, David J. Scurr, Emily F. Smith
Publikováno v:
Surface and Interface Analysis. 49:953-959
X-ray photoelectron spectroscopy (XPS) was used in conjunction with gas cluster ion source etching to analyze polystyrene and polyvinylpyrrolidone multilayer samples, total thickness ~15 μm, to establish optimal conditions for depth profiles over ma
Publikováno v:
Microscopy and Microanalysis. 26:1010-1011
Publikováno v:
The Journal of Physical Chemistry C. 120:25317-25327
We present experimental data on the angular distribution of Irganox 1010 organic molecules sputtered by large argon gas cluster projectiles (E/n = 5 eV, 10 keV Ar2000). Ejection probability distributions as derived from deposit patterns on planar col