Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Jonathan D. Chisum"'
Autor:
Matthew J. Filmer, Matthew Huebner, Thomas A. Zirkle, Xavier Jehl, Marc Sanquer, Jonathan D. Chisum, Alexei O. Orlov, Gregory L. Snider
Publikováno v:
Scientific Reports, Vol 12, Iss 1, Pp 1-13 (2022)
Abstract Sensitive dispersive readouts of single-electron devices (“gate reflectometry”) rely on one-port radio-frequency (RF) reflectometry to read out the state of the sensor. A standard practice in reflectometry measurements is to design an im
Externí odkaz:
https://doaj.org/article/09338ece8b174bedbf6a93dd4bf41339
Autor:
Nicholas J. Estes, Xiwen Kang, Xiangbo Meng, Ralf Bendlin, Aditya Chopra, J. Nicholas Laneman, Bertrand M. Hochwald, Jonathan D. Chisum
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 71:1793-1808
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11b10934ca15ec96dbeddb5ce6ed617b
https://doi.org/10.1109/tmtt.2022.3222424
https://doi.org/10.1109/tmtt.2022.3222424
Autor:
Nicolas C. Garcia, Jonathan D. Chisum
Publikováno v:
IEEE Transactions on Antennas and Propagation. 70:7501-7512
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a881c0837bbdb4c64ebde02faadc1bbf
https://doi.org/10.1109/tap.2022.3182420
https://doi.org/10.1109/tap.2022.3182420
Autor:
Kang Gao, Xiangbo Meng, J. Nicholas Laneman, Jonathan D. Chisum, Ralf Bendlin, Aditya Chopra, Bertrand M. Hochwald
Publikováno v:
IEEE Transactions on Communications. 70:5151-5163
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92ecc7f7beebede1e56ecbcabf5e5912
https://doi.org/10.1109/tcomm.2022.3182747
https://doi.org/10.1109/tcomm.2022.3182747
Publikováno v:
IEEE Transactions on Cognitive Communications and Networking. 8:763-777
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79b5ca9263c2010f07307ff1efb6cec8
https://doi.org/10.1109/tccn.2022.3140770
https://doi.org/10.1109/tccn.2022.3140770
Autor:
Rene Celis-Cordova, Ethan M. Williams, Gabriel J. Quintero Cayaspo, Jacob J. Gose, Abigail F. Brown, Jonathan D. Chisum, Alexei O. Orlov, Gregory L. Snider
Publikováno v:
2022 IEEE Silicon Nanoelectronics Workshop (SNW).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6fc19f9b2f495e7e8254dc18b50588de
https://doi.org/10.1109/snw56633.2022.9889036
https://doi.org/10.1109/snw56633.2022.9889036
Autor:
Matthew J. Filmer, Matthew Huebner, Thomas A. Zirkle, Xavier Jehl, Marc Sanquer, Jonathan D. Chisum, Alexei O. Orlov, Gregory L. Snider
Publikováno v:
Scientific Reports
Scientific Reports, 2022, 12 (1), pp.3098. ⟨10.1038/s41598-022-06727-1⟩
Scientific Reports, 2022, 12 (1), pp.3098. ⟨10.1038/s41598-022-06727-1⟩
Sensitive dispersive readouts of single-electron devices (“gate reflectometry”) rely on one-port radio-frequency (RF) reflectometry to read out the state of the sensor. A standard practice in reflectometry measurements is to design an impedance t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b381e775b83c6b8761bf7b5ba7bf2b8
https://pubmed.ncbi.nlm.nih.gov/35197499
https://pubmed.ncbi.nlm.nih.gov/35197499
Publikováno v:
2009 European Microwave Conference (EuMC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::214be269b4a35a15d6baa08a77106a7f
https://doi.org/10.23919/eumc.2009.5295982
https://doi.org/10.23919/eumc.2009.5295982