Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Jonathan Chuah"'
Autor:
Jonathan Chuah, Anjam Khursheed
Publikováno v:
Materials, Vol 14, Iss 24, p 7511 (2021)
This paper presents the design of a reflection electron energy spectrometer (REELS) attachment for low voltage scanning electron microscopy (LVSEM) applications. The design is made by carrying out a scattered electron trajectory ray paths simulation.
Externí odkaz:
https://doaj.org/article/4bf23b674ca7447d94143ec4b3ec2c9f