Survey of Models for Acquiring the Optical Properties of Translucent Materials

Autor: Li Yang, Søren Gregersen, Jeppe Revall Frisvad, Soeren A. Jensen, Jonas Skovlund Madsen, Youri Meuret, Poul Erik Hansen, António Correia

Publikováno v: Frisvad, J R, Jensen, S A, Madsen, J S, Correia, A, Yang, L, Gregersen, S K S, Meuret, Y & Hansen, P E 2020, ' Survey of Models for Acquiring the Optical Properties of Translucent Materials ', Computer Graphics Forum, vol. 39, no. 2, pp. 729-755 . https://doi.org/10.1111/cgf.14023

The outset of realistic rendering is a desire to reproduce the appearance of the real world. Rendering techniques therefore operate at a scale corresponding to the size of objects that we observe with our naked eyes. At the same time, rendering techn

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c302deb225320cbc084f1316fb26e619
https://doi.org/10.1111/cgf.14023

Scatterometry for optimization of injection molded nanostructures at the fabrication line

Autor: Alicia Johansson, Lars Nakotte, Theodor Nielsen, Søren Alkærsig Jensen, Jonas Skovlund Madsen, Jesper Nygård, Jørgen Garnæs, Ilja Czolkos, Poul Erik Hansen, Arne Vogelsang, Lasse Højlund Thamdrup

Publikováno v: The International Journal of Advanced Manufacturing Technology. 99:2669-2676

A compact scatterometer has been build and tested at a production facility. The scatterometer is used to characterize the feature dimensions of injection molded polymer nanostructures and give on-site direct feedback to the operator on the produced q

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5c83ec53471c263b87e09706db44eb21
https://doi.org/10.1007/s00170-018-2665-7

In-line characterization of nanostructures produced by roll-to-roll nanoimprinting

Autor: Raimo Korhonen, Brian Bilenberg, Maksim Zalkovskij, Jonas Skovlund Madsen, Mathias Geisler, Mikkel Berri Lotz, Søren Alkærsig Jensen, Poul Erik Hansen, Petri Peltonen

Publikováno v: Optics Express. 29:3882

We present an in-line metrology solution for dimensional characterization of roll-to-roll imprinted nanostructures. The solution is based on a scatterometric analysis of optical data from a hyperspectral camera deployed at a production facility, wher

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64fec882adb48a0ddd70905dce635457
https://doi.org/10.1364/oe.411669

Plasmonic color metasurfaces fabricated by a high speed roll-to-roll method

Autor: Henrik Chresten Pedersen, Poul-Erik Hansen, Henrik Pranov, Jonas Skovlund Madsen, Swathi Murthy, Rafael J. Taboryski, Nikolaj Agentoft Feidenhans'l

Publikováno v: Murthy, S, Pranov, H, Feidenhans'l, N A, Madsen, J S, Hansen, P E, Pedersen, H C & Taboryski, R J 2017, ' Plasmonic color metasurfaces fabricated by a high speed roll-to-roll method ', Nanoscale, vol. 9, pp. 14280-14287 . https://doi.org/10.1039/c7nr05498j

Lab-scale plasmonic color printing using nano-structured and subsequently metallized surfaces have been demonstrated to provide vivid colors. However, upscaling these structures for large area manufacturing is extremely challenging due to the require

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a10b949db68fe0174cc95535f31e5546
https://pubmed.ncbi.nlm.nih.gov/28914951

Modeling surface imperfections in thin films and nanostructured surfaces

Autor: Mirza Karamehmedovic, Jonas Skovlund Madsen, M. Madsen, Søren Alkærsig Jensen, Poul-Erik Hansen

Publikováno v: Hansen, P-E, Madsen, J S, Jensen, S A, Madsen, M H & Karamehmedović, M 2017, Modeling surface imperfections in thin films and nanostructured surfaces . in Proceedings of SPIE . vol. 10330, 103300J, SPIE-International Society for Optical Engineering, Proceedings of SPIE-The International Society for Optical Engineering, Modeling Aspects in Optical Metrology, Munich, Germany, 25/06/2017 . https://doi.org/10.1117/12.2270232
Hansen, P-E, Madsen, J S, Jensen, S A, Madsen, M H & Karamehmedovic, M 2017, ' Modeling surface imperfections in thin films and nanostructured surfaces ', Proceedings of SPIE, vol. 10330, 103300J, pp. 1-4 . https://doi.org/10.1117/12.2270232

Accurate scatterometry and ellipsometry characterization of non-perfect thin films and nanostructured surfaces are challenging. Imperfections like surface roughness make the associated modelling and inverse problem solution difficult due to the lack

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8a42d11b3b5a313808a5a5c81dc6cffd
https://orbit.dtu.dk/en/publications/253f0d2d-83df-459f-ac6d-7c905796fbf5