Zobrazeno 1 - 10
of 31
pro vyhledávání: '"Jon Martens"'
Publikováno v:
IEEE Microwave Magazine. 24:133-137
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4344208deca5a9a7d485d0e56ab4cf36
https://doi.org/10.1109/mmm.2023.3242847
https://doi.org/10.1109/mmm.2023.3242847
Autor:
Jon Martens
Publikováno v:
European Journal of Training and Development, 2014, Vol. 38, Issue 1/2, pp. 40-53.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/EJTD-09-2013-0092
Autor:
Akim A. Babenko, Jon Martens
Publikováno v:
2022 99th ARFTG Microwave Measurement Conference (ARFTG).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0232d6d619068d28b410d6ae6b6babcc
https://doi.org/10.1109/arftg54656.2022.9896519
https://doi.org/10.1109/arftg54656.2022.9896519
Publikováno v:
2021 51st European Microwave Conference (EuMC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40dca1430b30e178ff3a03b76877bcdb
https://doi.org/10.23919/eumc50147.2022.9784277
https://doi.org/10.23919/eumc50147.2022.9784277
Publikováno v:
IEEE Microwave Magazine. 23(5)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8bb8b8725174d68e06b3125bc492008
http://resolver.tudelft.nl/uuid:6b848704-3518-42b7-ae5c-711b68c2a15c
http://resolver.tudelft.nl/uuid:6b848704-3518-42b7-ae5c-711b68c2a15c
Publikováno v:
2020 95th ARFTG Microwave Measurement Conference (ARFTG).
Broadband network analysis measurements can simplify on-wafer device and subsystem modeling (and related) efforts by minimizing setup changes and calibration cycles. Instrument coverage from low frequencies to 220 GHz has been recently presented but,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec6119048962e718e58b60c0afd5d909
https://doi.org/10.1109/arftg47271.2020.9241377
https://doi.org/10.1109/arftg47271.2020.9241377
Publikováno v:
2020 94th ARFTG Microwave Measurement Symposium (ARFTG).
We developed models for Type-N coaxial vector network analyzer (VNA) calibration kits within the NIST Microwave Uncertainty Framework. First, we created physical models of commercially-available standards that support multiline thru-reflect-line (TRL
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67369a3e004c2c7280f5125d4b349a12
https://doi.org/10.1109/arftg47584.2020.9071653
https://doi.org/10.1109/arftg47584.2020.9071653
Publikováno v:
Journal For Virtual Worlds Research. 12
Virtual reality and virtual worlds (VWs) are powerful technologies currently helping to define the digital world. These technologies are characterized by user control, immersion, and a sense of presence or “being there.” They have been examined f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25196b2d28c55e2a7659f88f4541da1c
https://doi.org/10.4101/jvwr.v12i3.7366
https://doi.org/10.4101/jvwr.v12i3.7366
Autor:
Jon Martens
Publikováno v:
IEEE Microwave Magazine. 19:35-48
As instantaneous bandwidths and overall frequency ranges continue to increase in wireless communications, measurement requirements, even at the device and subsystem level, are evolving not just to capture the upper frequency limit but also to evaluat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8547bd2baf41161e6a310024fe45b7e8
https://doi.org/10.1109/mmm.2017.2779679
https://doi.org/10.1109/mmm.2017.2779679
Autor:
Jon Martens, Peter H. Aaen
Publikováno v:
IEEE Microwave Magazine. 21:33-34
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::315c8832e3456918fe68d0c6c85f6eef
https://doi.org/10.1109/mmm.2020.2971396
https://doi.org/10.1109/mmm.2020.2971396