Zobrazeno 1 - 10
of 39
pro vyhledávání: '"Jolene D Splett"'
Publikováno v:
J Opt Soc Am B
To calibrate an optical transition edge sensor, for each pulse of the light source (e.g., pulsed laser), one must determine the ratio of the expected number of photons that deposit energy and the expected number of photons created by the laser. Based
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03e186a8731e919f6e99023e32acab24
https://europepmc.org/articles/PMC9888196/
https://europepmc.org/articles/PMC9888196/
NIST has developed a software package that allows users to fit test results obtained from Charpy or toughness tests as a function of test temperature, thereby obtaining so-called transition curves. Non-linear fitting is available for five regression
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::027e0a51e72061a6c519471c21aba98f
https://doi.org/10.6028/nist.tn.2158
https://doi.org/10.6028/nist.tn.2158
Autor:
Jolene D. Splett, Duncan A. McGillivray, Aric W. Sanders, Michael Frey, John M. Ladbury, Adam Wunderlich, Jason B. Coder, Azizollah Kord, Lucas N. Koepke, Daniel G. Kuester
This report presents a laboratory-based characterization of Long Term Evolution (LTE) User Equipment (UE) emissions under closed-loop power control, building on our prior work (NIST TN 2069), which assessed the impact of a large number of factors aff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::772e20bc9f0614917a961af4a3294aed
https://doi.org/10.6028/nist.tn.2147
https://doi.org/10.6028/nist.tn.2147
Publikováno v:
IEEE journal of selected topics in applied earth observations and remote sensing
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Vol 13, Pp 3281-3290 (2020)
Conference on Characterization and Radiometric Calibration for Remote Sensing (CALCON)
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Vol 13, Pp 3281-3290 (2020)
Conference on Characterization and Radiometric Calibration for Remote Sensing (CALCON)
We directly quantify the effect of infrequent calibration on the stability of microwave radiometer temperature measurements (where a power measurement for the unknown source is acquired at a fixed time, but calibration data are acquired at variable e
Autor:
John (Jack) W. Ekin, Bernardo Bordini, Luca Bottura, Loren F. Goodrich, Najib Cheggour, Jolene D. Splett, D. Richter
Publikováno v:
IEEE Transactions on Applied Superconductivity. 27:1-7
Scaling analysis of several thousand Nb 3 Sn critical-current (I c ) measurements is used to derive the extrapolative scaling expression (ESE), a fitting equation that can quickly and accurately extrapolate (or interpolate) limited datasets to obtain
Publikováno v:
Scientific Reports
Scientific Reports, Vol 9, Iss 1, Pp 1-1 (2019)
Scientific Reports, Vol 9, Iss 1, Pp 1-1 (2019)
A correction to this article has been published and is linked from the HTML and PDF versions of this paper. The error has been fixed in the paper.
Publikováno v:
Scientific Reports
Scientific Reports, Vol 9, Iss 1, Pp 1-14 (2019)
Scientific Reports, Vol 9, Iss 1, Pp 1-14 (2019)
The strain irreversibility cliff (SIC), marking the abrupt change of the intrinsic irreversible strain limit εirr,0 as a function of heat-treatment (HT) temperature θ in Nb3Sn superconducting wires made by the restacked-rod process (RRP®), is conf
Autor:
Jack C. M. Wang, Alan L. Migdall, Jolene D. Splett, Sae Woo Nam, Thomas Gerrits, Igor Vayshenker, John H. Lehman, Joshua C. Bienfang
We measure the detection efficiency of single-photon detectors at wavelengths near 851 nm and 1533.6 nm. We investigate the spatial uniformity of one free-space-coupled single-photon avalanche diode and present a comparison between fusion-spliced and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::592c83d103695d0977126c809d71e42c
Autor:
Nathan A. Tomlin, C. S. Yung, Jolene D. Splett, Paul A. Williams, Malcolm G. White, David J. Livigni, Joshua A. Hadler, John H. Lehman, Michelle Stephens, Matthew Spidell, Igor Vayshenker, Thomas Gerrits, Amanda Koepke, Gordon A. Shaw
Laser power metrology at the National Institute of Standards and Technology (NIST) ranges 20 orders of magnitude from photon-counting (1000 photons/s) to 100 kW (10^23 photons/s at a wavelength of 1070 nm). As a part of routine practices, we perform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d35566c0e29cca5f73f4e314153cd30c