Zobrazeno 1 - 2
of 2
pro vyhledávání: '"John Y. T. Wei"'
Publikováno v:
AIP Advances, Vol 8, Iss 5, Pp 055022-055022-7 (2018)
We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-an
Externí odkaz:
https://doaj.org/article/6419dbdc78614736b93d10c137197766
Autor:
Robert M. Hazen, David R. Veblen, Charles T. Hultgren, N. G. Asmar, Donald E. Morris, Ulrich M. Scheven, John Y. T. Wei, Janice H. Nickel, Jeffrey E. Post, Peter J. Heaney, Andrea Markelz, Jeffrey S. Scott
Publikováno v:
Physical review. B, Condensed matter. 39(10)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e7076ee47b05008465d597ed5f125ddb
https://pubmed.ncbi.nlm.nih.gov/9947406
https://pubmed.ncbi.nlm.nih.gov/9947406