Zobrazeno 1 - 10
of 98
pro vyhledávání: '"John T. Armstrong"'
Publikováno v:
American Mineralogist. 101:1839-1853
It is well known that trace element sensitivity in electron probe microanalysis (EPMA) is limited by intrinsic random variation in the X-ray continuum background and weak signals at low concentrations. The continuum portion of the background is produ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::47a359d800c638cdd269b27587955fab
https://doi.org/10.2138/am-2016-5628
https://doi.org/10.2138/am-2016-5628
Autor:
Grethe Hystad, Dimitri A. Sverjensky, Melissa McMillan, Robert M. Hazen, Holly J. Stein, Aaron Zimmerman, Robert T. Downs, John T. Armstrong, Joshua J. Golden, Ian Goldstein
Publikováno v:
Earth and Planetary Science Letters. 366:1-5
Temporal trends in Earth's near-surface mineralogy correlate with major events in Earth's geochemical and tectonic history. New and published analyses of 422 molybdenite (MoS2) specimens from 135 localities with known ages from 2.91 billion years (Ga
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a923bdffc81898ee394be3768eb39f2
https://doi.org/10.1016/j.epsl.2013.01.034
https://doi.org/10.1016/j.epsl.2013.01.034
Autor:
Massimo Marengo, Margarita Karovska, Dimitar D. Sasselov, Costas Papaliolios, John T. Armstrong, Tyler E. Nordgren
Publikováno v:
The Astrophysical Journal. 589:968-975
The geometric Baade-Wesselink method is one of the most promising techniques for obtaining a better calibration of the Cepheid period-luminosity relation by means of interferometric measurements of accurate diameters. In this paper we present new wav
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::75c63fd2482623602bd75faabba59df8
https://doi.org/10.1086/374736
https://doi.org/10.1086/374736
Autor:
Lawrence H. Robins, Joseph G. Pellegrino, Kristine A. Bertness, John T. Armstrong, Albert J. Paul, Ryna B. Marinenko
Publikováno v:
Journal of Applied Physics. 93:3747-3759
In an effort to improve the accuracy of photoluminescence (PL) measurements of the Al mole fraction (x) of AlxGa1−xAs alloys, the PL peak emission energy, EPL,peak, was measured at room temperature for molecular-beam epitaxy-grown AlxGa1−xAs film
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::497d3b04373b4a6e891f33f29a738806
https://doi.org/10.1063/1.1556554
https://doi.org/10.1063/1.1556554
Autor:
Marc L. Salit, Ryna B. Marinenko, Kristine A. Bertness, Alexana Roshko, Albert J. Paul, John T. Armstrong, R J. Matyi, Lawrence H. Robins
Publikováno v:
physica status solidi (c). :992-997
Work is underway to develop composition standards and standardized assessment procedures for compound semiconductors. An AlGaAs composition standard with less than 2% uncertainty is being developed. The improved accuracy of this standard is being ach
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7826d9c6f0ac292fc2289e5f1fcf7ba4
https://doi.org/10.1002/pssc.200306245
https://doi.org/10.1002/pssc.200306245
Autor:
John T. Armstrong, John E. Bonevich, L. D. Rotter, Alexander L. Roytburd, Mark D. Vaudin, Darrell G. Schlom, Igor Levin, Debra L. Kaiser
Publikováno v:
Journal of Materials Research. 14:4657-4666
Thin films of composition (Ba,Sr)yTiO2+y with 0.43 ≤ y ≤; 1.64, were deposited by metalorganic chemical vapor deposition on (100) MgO substrates at various growth conditions. X-ray diffraction and transmission electron microscopy studies showed t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::762ba93886cb307a150e36468e3483a8
https://doi.org/10.1557/jmr.1999.0630
https://doi.org/10.1557/jmr.1999.0630
Autor:
John T. Armstrong
Publikováno v:
Analytical Chemistry. 71:2714-2724
The use of X-ray emission spectroscopy to determine the valence states of first-row transition elements is evaluated using measurements of X-ray wavelength shifts, line shapes, and relative X-ray line intensities (Lβ/Lα and Kβ/ Kα). X-ray wavelen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::764693c34749892baf4ee4ff3d6cd949
https://doi.org/10.1021/ac981214q
https://doi.org/10.1021/ac981214q
Autor:
John T. Armstrong, John J. Donovan
Publikováno v:
Microscopy and Microanalysis. 21:1445-1446
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bce71225c5515985b3188e596127d8ac
https://doi.org/10.1017/s1431927615008004
https://doi.org/10.1017/s1431927615008004
Autor:
Richard E. Cavicchi, Frank Dimeo, J T. Kelliher, Stephen Semancik, John A. Small, John S. Suehle, John T. Armstrong, N. H. Tea
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:131-138
Through the use of silicon micromachining, we have developed a microhotplate structure capable of reaching temperatures in excess of 500 °C, onto which thin films have been selectively grown via metalorganic chemical vapor deposition. The microhotpl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13d14b4389db60fd44d5d441bd9cf171
https://doi.org/10.1116/1.580959
https://doi.org/10.1116/1.580959
Publikováno v:
SPIE Proceedings.
When defining surface irregularities more often than not it is useful to represent these as slope errors rather than surface errors. However, surface error specifications are more commonly used even though they do not accurately represent performance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::239b8ac2dcc8d4c78d51e387b14ab226
https://doi.org/10.1117/12.931112
https://doi.org/10.1117/12.931112