Zobrazeno 1 - 10
of 12
pro vyhledávání: '"John Scharf"'
Autor:
Marie Vanisko, John Scharf
Publikováno v:
2002 Annual Conference Proceedings.
Autor:
Clay DeHart, Brian Egaas, Rommel Noufi, Miguel A. Contreras, John Scharf, Bobby To, Ingrid Repins, Craig L. Perkins
Publikováno v:
Progress in Photovoltaics: Research and Applications. 16:235-239
We report a new record total-area efficiency of 19·9% for CuInGaSe2-based thin-film solar cells. Improved performance is due to higher fill factor. The device was made by three-stage co-evaporation with a modified surface termination. Growth conditi
Autor:
Anthony Szpilka, John Scharf
Publikováno v:
Interdisciplinary Lively Application Projects. :143-160
Autor:
Dean H. Levi, Matthew Young, Jian V. Li, Rommel Noufi, John Scharf, Thomas E. Furtak, Miguel A. Contreras
Publikováno v:
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).
An in situ optical metrology has been developed to provide real time control of three crucial film properties during the 3-stage deposition of Cu(In1-xGax)Se2 thin films. These properties include: (1) the overall Cu/(In+Ga) ratio; (2) the distributio
Autor:
Joel Pankow, Rommel Noufi, Lorelle M. Mansfield, Stephen Glynn, John Scharf, Jian V. Li, Steve Christensen, Jonathan Mann, Miguel A. Contreras, Kannan Ramanathan
Publikováno v:
2012 38th IEEE Photovoltaic Specialists Conference.
Zn(O,S) thin films were deposited by chemical bath deposition (CBD), atomic layer deposition, and sputtering. Composition of the films and band gap were measured and found to follow the trends described in the literature. CBD Zn(O,S) parameters were
Autor:
Changwon Suh, David Biagioni, John Scharf, John D. Perkins, Miguel A. Contreras, Kristin Munch, Stephen Glynn, Wesley Jones, Brent P. Nelson
Publikováno v:
MRS Proceedings. 1425
We discuss our current research focus on photovoltaic (PV) informatics, which is dedicated to functionality enhancement of solar materials through data management and data mining-aided, integrated computational materials engineering (ICME) for rapid
Autor:
Stephen Glynn, Miguel A. Contreras, John Scharf, Changwon Suh, David Biagioni, Wesley Jones, Rommel Noufi
Publikováno v:
2011 37th IEEE Photovoltaic Specialists Conference.
We demonstrate how advanced exploratory data analysis coupled to data-mining techniques can be used to scrutinize the high-dimensional data space of photovoltaics in the context of thin films of Al-doped ZnO (AZO), which are essential materials as a
Autor:
John Scharf, Rommel Noufi, Kristin Munch, David Biagioni, Stephen Glynn, Miguel A. Contreras, Wesley Jones, Changwon Suh
Publikováno v:
SPIE Newsroom.
Autor:
John Scharf, Rommel Noufi, Steve Johnston, Clay DeHart, Yanfa Yan, Wyatt K. Metzger, Brian E. McCandless, Miguel A. Contreras, Jian V. Li, Manuel J. Romero, Ingrid Repins, Brian Egaas
Publikováno v:
2008 33rd IEEE Photovolatic Specialists Conference.
We recently reported a new record total-area efficiency, 19.9%, for CuInGaSe2 (CIGS)-based thin-film solar cells [1]. Current-voltage analysis indicates that improved performance in the record device is due to reduced recombination. The reduced recom
Autor:
Rommel Noufi, David L. Young, Ramesh Dhere, Helio Moutinho, John Scharf, Kannan Ramanathan, Bobby To, Anna Duda
Publikováno v:
MRS Proceedings. 1012
We present our work on development of Cd1-xMgxTe (CMT) polycrystalline thin film for solar cells for tandem cell applications. CMT thin films were fabricated by co-evaporation of CdTe and Mg at a substrate temperature of 400˚C. The spatial separatio