Zobrazeno 1 - 6
of 6
pro vyhledávání: '"John Roehling"'
Autor:
Per Söderlind, Alexander Landa, Emily E. Moore, Aurélien Perron, John Roehling, Joseph T. McKeown
Publikováno v:
Applied Sciences, Vol 13, Iss 4, p 2123 (2023)
We present high-temperature thermodynamic properties for uranium in its γ phase (γ-U) from first-principles, relativistic, and anharmonic theory. The results are compared to CALPHAD modeling. The ab initio electronic structure is obtained from dens
Externí odkaz:
https://doaj.org/article/66e67df037dc4ca08b71b7f0198d6a25
Publikováno v:
ACS Energy Letters. 7:3392-3400
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc707777c0ee7bf81289eeab56b64148
https://doi.org/10.1021/acsenergylett.2c01630
https://doi.org/10.1021/acsenergylett.2c01630
Autor:
Mariana Desireé Reale Batista, Alyssa Troksa, Hannah Eshelman, Michael Bagge-Hansen, John Roehling
Radiative cooling materials continue to underperform compared to their theoretical potential due to parasitic heating from contact with ambient air. Solutions to this problem are expensive or complex to fabricate. Here, a potentially inexpensive, sim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4761922b41adfed2da1b1c409e724746
https://doi.org/10.22541/au.167845407.79020772/v1
https://doi.org/10.22541/au.167845407.79020772/v1
Publikováno v:
Microscopy Today. 29:46-54
With the growing applications of temporally resolved electron microscopy for probing basic phenomena and reducing beam-induced damage, a multifaceted introduction to the field of ultrafast transmission electron microscopy is provided. This primer inc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff4f5afa3f2ca51931605e2452ed44a0
https://doi.org/10.1017/s1551929521001140
https://doi.org/10.1017/s1551929521001140
Autor:
Darrin Leonhardt, Eric Montgomery, Chunguang Jing, Bart Wyderski, Yubin Zhao, Spencer Reisbick, Yimei Zhu, June Lau, John Roehling
Publikováno v:
Microscopy and Microanalysis. 28:1802-1803
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f18d2ab1727ad3aa4dba8df1f0263549
https://doi.org/10.1017/s1431927622007127
https://doi.org/10.1017/s1431927622007127
Publikováno v:
Journal of Nanoelectronics and Optoelectronics. 8:260-266
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f06e690d44afd73e9fe1bc3925a446c1
https://doi.org/10.1166/jno.2013.1462
https://doi.org/10.1166/jno.2013.1462