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pro vyhledávání: '"John Ormando"'
Autor:
Robert Mikkola, Brendan Foran, Gennadi Bersuker, John Ormando, Brad Carpenter, Michael E. Thomas, Qing-Tang Jiang
Publikováno v:
MRS Proceedings. 564
Transformations in electroplated Cu films from a fine to course grain crystal structure (average grain sizes went from ∼0.1 µm to several microns) were observed to strongly depend on film thickness and geometry. Thinner films underwent much slower
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::708e7365e8573b24567545c81353f1cf
https://doi.org/10.1557/proc-564-429
https://doi.org/10.1557/proc-564-429
