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pro vyhledávání: '"John McElearney"'
Publikováno v:
Physical Review Materials. 6
Publikováno v:
Journal of Electronic Materials. 48:3376-3382
GaAs1−xBix has been grown by solid-source molecular beam epitaxy using varying substrate rotation rates. Changes in local bismuth saturation were studied by varying the Bi/Ga pressure ratio across the wafer. Films were grown on both GaAs and InGaAs
Publikováno v:
Semiconductor Science and Technology. 35:105006
Films of n-GaAs1-xBix films were grown via molecular beam epitaxy using both Si and Te as dopant sources. Electron mobility was characterized by Hall effect measurements as a function of carrier concentration and Bi content for films with bismuth fra