Zobrazeno 1 - 4
of 4
pro vyhledávání: '"John Kolasinski"'
Autor:
Clayton S.C. Yang, Dina M. Bower, Feng Jin, Tilak Hewagama, Shahid Aslam, Conor A. Nixon, John Kolasinski, Alan C. Samuels
Publikováno v:
MethodsX, Vol 9, Iss , Pp 101647- (2022)
Laser Induced Breakdown Spectroscopy (LIBS) in the Ultra Violet/Visible/Near-IR (UVN) spectral range is a powerful analytical tool that facilitates the interpretation of Raman spectroscopic data by providing additional details in elemental chemistry.
Externí odkaz:
https://doaj.org/article/fce398dac6f743cb9865a7e6ec3e855d
Autor:
Dat Tran, Nicolas . Gorius, Gerry Quilligan, Qian Gong, John Kolasinski, Todd Purser, Ariel Siguelnitzky, James E. Parker, Don Wegel, Daniel Glavin, Perry Gerakines, Shahid Aslam, Thuc Phan, George Nehmetallah
Publikováno v:
Sensors and Systems for Space Applications XV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::731e5eb31316e6d91f4efd12b2960df1
https://doi.org/10.1117/12.2619116
https://doi.org/10.1117/12.2619116
Autor:
Clayton S.C. Yang, Dina M. Bower, Feng Jin, Tilak Hewagama, Shahid Aslam, Conor A. Nixon, John Kolasinski, Alan C. Samuels
Publikováno v:
MethodsX. 9
Laser Induced Breakdown Spectroscopy (LIBS) in the Ultra Violet/Visible/Near-IR (UVN) spectral range is a powerful analytical tool that facilitates the interpretation of Raman spectroscopic data by providing additional details in elemental chemistry.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3f3b73ba60696e417cc521c2f43391b7
https://pubmed.ncbi.nlm.nih.gov/35308253
https://pubmed.ncbi.nlm.nih.gov/35308253
Publikováno v:
Journal of Atmospheric and Oceanic Technology. 22:605-627
Conventional wisdom is that lidar pulses do not significantly penetrate clouds having an optical thickness exceeding about τ = 2, and that no returns are detectible from more than a shallow skin depth. Yet optically thicker clouds of τ ≫ 2 reflec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52d58bd24bdabe2594c305486bb37bff
https://doi.org/10.1175/jtech1740.1
https://doi.org/10.1175/jtech1740.1