Zobrazeno 1 - 10
of 10
pro vyhledávání: '"John Golz"'
Autor:
Pooja Batra, Spyridon Skordas, Douglas LaTulipe, Kevin Winstel, Chandrasekharan Kothandaraman, Ben Himmel, Gary Maier, Bishan He, Deepal Wehella Gamage, John Golz, Wei Lin, Tuan Vo, Deepika Priyadarshini, Alex Hubbard, Kristian Cauffman, Brown Peethala, John Barth, Toshiaki Kirihata, Troy Graves-Abe, Norman Robson, Subramanian Iyer
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 4, Iss 2, Pp 77-89 (2014)
For high-volume production of 3D-stacked chips with through-silicon-vias (TSVs), wafer-scale bonding offers lower production cost compared with bump bond technology and is promising for interconnect pitches smaller than 5 µ using available tooling.
Externí odkaz:
https://doaj.org/article/5d342730d32a4aa79b9afe5a7e24598b
Autor:
Alberto Cestero, Rajesh R. Tummuru, Toshiaki Kirihata, John Golz, Balaji Jayaraman, Ramesh Raghavan, Ming Yin, Thejas Kempanna, Subramanian S. Iyer, Dan Moy, Faraz Khan, Janakiraman Viraraghavan, Derek H. Leu
Publikováno v:
IEEE Journal of Solid-State Circuits. 53:949-960
This paper describes the design and implementation of an 80-kb logic-embedded non-volatile multi-time programmable memory (MTPM) with no added process complexity. Charge trap transistors (CTTs) that exploit charge trapping and de-trapping behavior in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bd1437e6f81cd53e5330aeb23239f0d
https://doi.org/10.1109/jssc.2017.2784760
https://doi.org/10.1109/jssc.2017.2784760
Autor:
Troy L. Graves-Abe, Gary W. Maier, Subramanian S. Iyer, Norman Robson, Daniel Berger, Pooja R. Batra, John Golz, Toshiaki Kirihata, Matthew R. Wordeman
Publikováno v:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems. 6:373-384
This paper describes orthogonal scaling of dynamic-random-access-memories (DRAMs) using through-silicon-vias (TSVs). We review 3D DRAMs including DDR3, wide I/O mobile DRAM (WIDE I/O), and more recently, the hybrid-memory cube (HMC) and high-bandwidt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38305cd95ff9dae6924c6ab077315229
https://doi.org/10.1109/jetcas.2016.2547738
https://doi.org/10.1109/jetcas.2016.2547738
Autor:
Thejas Kempanna, Rajesh R. Tummuru, Ramesh Raghavan, Janakiraman Viraraghavan, Faraz Khan, Robert E. Kilker, Subramanian S. Iyer, Toshiaki Kirihata, Ming Yin, Derek H. Leu, Dan Moy, Alberto Cestero, John Golz, Balaji Jayaraman
Publikováno v:
VLSI Circuits
An 80Kb logic Embedded Multi-Time Programmable Memory (MTPM) employs charge trapping and de-trapping behavior in 32nm/22nm High-K transistor, resulting in no added process complexity. Multi-step verification with overwrite protection employs block-wr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0cbba329b90e50e1bb89bbc06ca221dd
https://doi.org/10.1109/vlsic.2016.7573462
https://doi.org/10.1109/vlsic.2016.7573462
Autor:
S. S. Iyer, Hien Minh Le, Abraham Mathews, Gregory J. Fredeman, P. Wilcox, Hung Ngo, John E. Barth, Trong V. Luong, R. Freese, Peter Juergen Klim, Erik A. Nelson, G. Koch, John Golz, William Robert Reohr, Hillery C. Hunter, Jente B. Kuang, Paul C. Parries, A. Khargonekar, T. Kirihata, D. Dick
Publikováno v:
2008 IEEE Symposium on VLSI Circuits.
We present a 1 MB cache subsystem that integrates 2 GHz embedded DRAM macros, charge pump circuits, a 4 Kb one-time-programmable ROM, clock multipliers, and built-in self test circuitry, having a 36.5 GB/s peak system data-rate. The eDRAM employs a p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa22d4b318c8e10e90b9dcbeb4834f30
https://doi.org/10.1109/vlsic.2008.4586008
https://doi.org/10.1109/vlsic.2008.4586008
Autor:
John Golz, Hudson, A.
Publikováno v:
Europe PubMed Central
Scopus-Elsevier
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::899c59164614e5df58961f60a0729bc2
http://europepmc.org/abstract/med/12045283
http://europepmc.org/abstract/med/12045283
Conference
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Conference
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Autor:
Françoise Monéger, Etienne Farcot, Jan Traas, Pradeep Das, Jérôme Chopard, Frédérique Rozier, Sandrine Paindavoine, Camillo La Rota, Christophe Godin
Publikováno v:
The Plant cell
The Plant cell, 2011, 23 (12), pp.4318-433. ⟨10.1105/tpc.111.092619⟩
The Plant cell, American Society of Plant Biologists (ASPB), 2011, 23 (12), pp.4318-433. ⟨10.1105/tpc.111.092619⟩
Plant Cell 12 (23), 4318-4333. (2011)
The Plant cell, 2011, 23 (12), pp.4318-433. ⟨10.1105/tpc.111.092619⟩
The Plant cell, American Society of Plant Biologists (ASPB), 2011, 23 (12), pp.4318-433. ⟨10.1105/tpc.111.092619⟩
Plant Cell 12 (23), 4318-4333. (2011)
Flower patterning is determined by a complex molecular network but how this network functions remains to be elucidated. Here, we develop an integrative modeling approach that assembles heterogeneous data into a biologically coherent model to allow pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e71c9eba8b17d2926c3b48557155579
https://doi.org/10.1105/tpc.111.092619
https://doi.org/10.1105/tpc.111.092619