Zobrazeno 1 - 10
of 20
pro vyhledávání: '"John G. Pasko"'
Autor:
Jagmohan Bajaj, John G. Pasko, Lester J. Kozlowski, Majid Zandian, Jose M. Arias, R. E. De Wames, W. E. Tennant
Publikováno v:
Journal of Electronic Materials. 24:1067-1076
Extensive material, device, and focal plane array (FPA) reproducibility data are presented to demonstrate significant advances made in the molecular beam epitaxial (MBE) HgCdTe technology. Excellent control of the composition, growth rate, layer thic
Publikováno v:
Journal of Electronic Materials. 24:681-684
Measurements of 77K RoA and 300K reverse bias dynamic impedance (RdA) products at one volt reverse bias has been carried out to assess the degree of correlation of this figure of merit. Planar P-on-n heterostructures were grown on near lattice-matche
Publikováno v:
Journal of Electronic Materials. 24:609-615
Temperature and time dependent Hg-annealing studies for arsenic activation have been carried out on As-doped molecular beam epitaxy HgCdTe eitherin situ or by ion implantation to determine the extent of arsenic activation in the single layer. Enhance
Autor:
Majid Zandian, G. M. Williams, W. E. Tennant, S. H. Shin, Jose M. Arias, R. E. De Wames, John G. Pasko, L. O. Bubulac
Publikováno v:
Journal of Electronic Materials. 22:1049-1053
We recently succeeded in fabricating planar Hg1−yCdyTe/Hg1−xCdxTe (x
Publikováno v:
Journal of Electronic Materials. 22:1039-1047
We report the results of annealing effects on the As-doped alloy HgCdTe grown by molecular beam epitaxy (MBE), arsenic (As) diffusion in HgCdTe from Hg-rich solutions at low temperatures, and As ion implantation at room temperature. Hall-effect measu
Autor:
G. Hildebrandt, Mark Farris, Kadri Vural, Craig A. Cabelli, Jagmohan Bajaj, John G. Pasko, James D. Garnett, Donald E. Cooper, John T. Montroy, Majid Zandian, Michael Carmody, Roger E. DeWames, Donald N. B. Hall, Jose Arias, J. Chow
Publikováno v:
Scientific Detectors for Astronomy ISBN: 9781402017889
Low background applications place the most stringent requirements on detector material, requiring the lowest possible dark currents, highest quantum efficiencies, negligible image persistence (image latency or “ghosts”), high operability, and goo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d9210e6baaffabc288bcfaf8854f15b
https://doi.org/10.1007/1-4020-2527-0_8
https://doi.org/10.1007/1-4020-2527-0_8
Publikováno v:
SPIE Proceedings.
We report significant improvements in the performance of short wavelength infrared 128 X 128 focal plane arrays at room temperature. Using InGaAs and HgCdTe detector materials coupled to readout multiplexers having gate modulated detector interface,
Publikováno v:
SPIE Proceedings.
Bajaj, Jose Arias, Majid Zandian, and John PaskoScience Center Rockwell International Corporation1049 Camino Dos Rios, Thousand Oaks, California 91358ABSTRACTDeep-level transient spectroscopy (DLTS) measurements were performed on midwavelength HgCdTe
Autor:
John G. Pasko, Jose M. Arias, Roger E. DeWames, Lester J. Kozlowski, Jagmohan Bajaj, Majid Zandian, W. E. Tennant
Publikováno v:
SPIE Proceedings.
Extensive material and device statistics of performance and reproducibility are presented to show the maturity of this technology. The demonstration vehicles to monitor yields during this demonstration were long-wavelength infrared (LWIR) HgCdTe mult
Publikováno v:
SPIE Proceedings.
Deep levels in p+n Hg0.73Cd0.27Te/Hg0.68Cd0.32Te planar heterostructure diodes, grown by molecular beam epitaxy on CdZnTe wafers, were studied using deep level transient spectroscopy (DLTS). The DLTS spectra showed the presence of at least two hole t