Zobrazeno 1 - 10
of 11
pro vyhledávání: '"John Bomback"'
Publikováno v:
Magnesium Technology 2000
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b99e33dcff056acd1398678a631cb18a
https://doi.org/10.1002/9781118808962.ch22
https://doi.org/10.1002/9781118808962.ch22
Publikováno v:
Journal of Applied Physics. 80:2768-2773
Ti and N were implanted into soda lime glass to doses up to 4.5×1017 cm−2 to reduce solar load and infrared transmission. Analysis of the Ti+N implant distributions by Rutherford backscattering spectrometry and x‐ray photoelectron spectroscopy (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a77883d77989375b5e3bdded996c8cc
https://doi.org/10.1063/1.363194
https://doi.org/10.1063/1.363194
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 106:560-566
Soda lime glass was given two types of implantations; Ti followed by N to doses up to 4.5 × 1017 cm−2 to reduce solar load and IR transmission, and Ti to doses of 8.2 × 1016 cm−2 to reduce reflectivity of visible light. Analysis of the Ti + N i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81998206e6b7f8d5ef3b75bae1d5ed5d
https://doi.org/10.1016/0168-583x(95)00770-9
https://doi.org/10.1016/0168-583x(95)00770-9
Publikováno v:
Applied Physics Letters. 66:142-144
Soda lime glass was implanted sequentially with Ti+ and N+ to doses ranging from 2 to 30×1016 cm−2 in order to study the resulting optical properties. Analysis of the implant distributions was made by using Rutherford backscattering and x‐ray ph
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::518f9c195199c3c17b387868cf8be141
https://doi.org/10.1063/1.113543
https://doi.org/10.1063/1.113543
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57c0ec7caa112bac97833712fa3fe9fd
https://doi.org/10.4271/2001-01-0646
https://doi.org/10.4271/2001-01-0646
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54f71602a5e830257187fa52295acb09
https://doi.org/10.4271/2000-01-1194
https://doi.org/10.4271/2000-01-1194
Autor:
John Bomback, Daniel D. Jack, R. Surowiec, S. Subramanian, Edward Nashed Boulos, C. J. Simmons, Joseph H. Simmons
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbb6bce5a019e6103ef8636a68e1e02a
https://doi.org/10.4271/970227
https://doi.org/10.4271/970227
Publikováno v:
Physical Review Letters. 57:1647-1650
This Letter reports optical third-harmonic generation in reflection from ion-implanted samples of silicon. The third-harmonic signal is found to exhibit certain novel polarization and rotational dependences, which can be understood with the aid of me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::62faaac751040e08e215d8ce41b76ec4
https://doi.org/10.1103/physrevlett.57.1647
https://doi.org/10.1103/physrevlett.57.1647
Publikováno v:
Ultramicroscopy. 22:305-317
Laser, electron and ion beam techniques were used to probe the near surface crystallography of silicon implanted with various ion species. Optical third harmonic radiation (THR) generated in reflection with short laser pulses was found to be a sensit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62a446cf2fad6a419f533982a3df5d58
https://doi.org/10.1016/0304-3991(87)90074-x
https://doi.org/10.1016/0304-3991(87)90074-x