Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Johanna Reck"'
Publikováno v:
Modeling Aspects in Optical Metrology VII.
Spectroscopic ellipsometry is a versatile tool to measure dimensional or optical parameters of surface layers or surface structures. The determination of these parameters requires to solve an inverse problem. This is achieved by a fitting procedure,
Publikováno v:
MRS Advances. 1:3139-3144
Niobium-doped TiO 2 films as highly transparent conducting oxidic electrodes were prepared by reactive magnetron sputtering from a titanium target in an argon-oxygen gas flow. As-deposited films were amorphous and exhibited high resistivities ranging
Publikováno v:
Measurement Science and Technology. 31:115010
There are some commonly-used optimization techniques for the analysis of measured data in spectroscopic Mueller matrix ellipsometry (MME) used, for example, to calculate the layer thicknesses of samples under test. Concentrating on the metrological a
Autor:
Christoph Janowitz, Jan Ingo Flege, Bernd Gruska, Hassan Gargouri, Johanna Reck, Karsten Henkel, Franziska Naumann, Ali Mahmoodinezhad, Adrian Blümich
Publikováno v:
Journal of Vacuum Science & Technology B. 38:014014
In situ real-time ellipsometry (irtE) with a very high time resolution of 24 ms was applied to monitor the inductively coupled plasma enhanced atomic layer deposition (ALD) process of Al2O3 thin films to precisely resolve each step of the ALD process
Publikováno v:
Biology, Vol 10, Iss 12, p 1307 (2021)
In a short-term model of hyperosmotic stress, primary murine astrocytes were stimulated with a hyperosmolar sucrose solution for five minutes. Astrocytic gap junctions, which are mainly composed of Connexin (Cx) 43, displayed immediate ultrastructura
Externí odkaz:
https://doaj.org/article/54390a3581a7444d8dd6a3bfb38079c4