Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Johanna Reck"'
Publikováno v:
Modeling Aspects in Optical Metrology VII.
Spectroscopic ellipsometry is a versatile tool to measure dimensional or optical parameters of surface layers or surface structures. The determination of these parameters requires to solve an inverse problem. This is achieved by a fitting procedure,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4635e901e5be09a033f672d1a214376d
https://doi.org/10.1117/12.2527866
https://doi.org/10.1117/12.2527866
Publikováno v:
MRS Advances. 1:3139-3144
Niobium-doped TiO 2 films as highly transparent conducting oxidic electrodes were prepared by reactive magnetron sputtering from a titanium target in an argon-oxygen gas flow. As-deposited films were amorphous and exhibited high resistivities ranging
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::659c5e5c834a3fb011d35a3ad87cc1f0
https://doi.org/10.1557/adv.2016.290
https://doi.org/10.1557/adv.2016.290
Publikováno v:
Measurement Science and Technology. 31:115010
There are some commonly-used optimization techniques for the analysis of measured data in spectroscopic Mueller matrix ellipsometry (MME) used, for example, to calculate the layer thicknesses of samples under test. Concentrating on the metrological a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::612cf250cde1475603d4d7ac8ee0dc4c
https://doi.org/10.1088/1361-6501/ab95da
https://doi.org/10.1088/1361-6501/ab95da
Publikováno v:
Optics Express. 28:8108
In this paper, we focus on the metrological aspects of spectroscopic Mueller ellipsometry—i.e. on the uncertainty estimation of the measurement results. With the help of simulated Mueller matrices, we demonstrate that the commonly used merit functi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dea2ce5b02faa305db51ef67b6f738b6
https://doi.org/10.1364/oe.381244
https://doi.org/10.1364/oe.381244
Autor:
Christoph Janowitz, Jan Ingo Flege, Bernd Gruska, Hassan Gargouri, Johanna Reck, Karsten Henkel, Franziska Naumann, Ali Mahmoodinezhad, Adrian Blümich
Publikováno v:
Journal of Vacuum Science & Technology B. 38:014014
In situ real-time ellipsometry (irtE) with a very high time resolution of 24 ms was applied to monitor the inductively coupled plasma enhanced atomic layer deposition (ALD) process of Al2O3 thin films to precisely resolve each step of the ALD process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02a3ef51094bb58f93a85217b71ce45b
https://doi.org/10.1116/1.5122797
https://doi.org/10.1116/1.5122797
Publikováno v:
Biology, Vol 10, Iss 12, p 1307 (2021)
In a short-term model of hyperosmotic stress, primary murine astrocytes were stimulated with a hyperosmolar sucrose solution for five minutes. Astrocytic gap junctions, which are mainly composed of Connexin (Cx) 43, displayed immediate ultrastructura
Externí odkaz:
https://doaj.org/article/54390a3581a7444d8dd6a3bfb38079c4