Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Johan Venter"'
Publikováno v:
IUCrData, Vol 8, Iss 4, p x230355 (2023)
The molecule of the title compound, [Rh(C13H10NO2){As(C6H5)3}(CO)] or [Rh(BPHA)(AsPh3)(CO)] (BPHA is the N-benzoyl-N-phenylhydroxylaminate anion), comprises a bidentate N-benzoyl-N-phenylhydroxylaminate anion coordinating through the O atoms to the s
Externí odkaz:
https://doaj.org/article/6d5e0d6e256b480f8dd0d420f2b1c0b4
Publikováno v:
Advances in Electrical and Electronic Engineering, Vol 20, Iss 1, Pp 66-72 (2022)
This article presents an outline of Electric Transient Disturbances (ETDs), represented by the ElectroStatic Discharge (ESD) in accordance with the Human-Body Model (HBM), on the AC-DC transfer measurement standard, represented by the Single-Junction
Externí odkaz:
https://doaj.org/article/c869fa7638fa4f718d3d69fa5a24ba40
Autor:
Johan Venter
Publikováno v:
2023 31st Southern African Universities Power Engineering Conference (SAUPEC).
Publikováno v:
2021 Southern African Universities Power Engineering Conference/Robotics and Mechatronics/Pattern Recognition Association of South Africa (SAUPEC/RobMech/PRASA).
Protecting power and distribution equipment from major faults will aid in preventing infrastructure damage and unnecessary power supply losses. Battery operated tripping units are used to open (trip) or re-close HT breakers in a substation during pow
Autor:
Saurabh Sinha, Johan Venter
Publikováno v:
2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO).
This paper introduces a mathematical relation between ac performance of the four-transistor (4T) pixel structure detector, which can be used to develop optimised detectors pre-manufacturing. The input to this model is the photon-generated current and
Publikováno v:
2019 11th International Conference on Electrical and Electronics Engineering (ELECO).
A practical method to test post-manufactured mechanical thermal and thermal-magnetic low voltage Moulded Case Circuit Breakers (MCCBs) is presented in this paper. Many standards pertaining to the ratings of low voltage MCCBs exist, but little literat
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 77:C1034-C1034
Publikováno v:
Fifth Conference on Sensors, MEMS, and Electro-Optic Systems.
Reduction in size and improvement of sensitive margins in modern semiconductor devices make them increasingly susceptible to stress and subsequent damage caused by the overvoltage. A fast responding and a higher energy absorbing overvoltage protectio
Publikováno v:
SPIE Proceedings.
Silicon-germanium (SiGe) bipolar complementary metal-oxide semiconductor (BiCMOS) transistors have vertical doping profiles reaching deeper into the substrate when compared to lateral CMOS transistors. Apart from benefiting from high-speed, high curr
Publikováno v:
Interactive Collaborative Learning ISBN: 9783319503394
Science, technology, engineering and mathematics education for high school learners in developing countries is a challenge for two significant reasons: equipment for education is expensive and complex, and economically-marginalized youth must be inte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92595b1497fb4fc7d8e806ffa8f21121
https://doi.org/10.1007/978-3-319-50340-0_44
https://doi.org/10.1007/978-3-319-50340-0_44