Zobrazeno 1 - 10
of 52
pro vyhledávání: '"Johan Snauwaert"'
Autor:
Nicolò Campagnol, Bao-Lian Su, Koen Robeyns, Alexandre Léonard, Nayarassery N. Adarsh, Johan Snauwaert, Marinela M. Dîrtu, Yann Garcia, Jan Fransaer, Anil D. Naik
Publikováno v:
Chemistry - A European Journal. 21:4300-4307
A conformationally flexible triazole-carboxylic acid ligand derived from an l-amino acid, namely, 4 H-1,2,4-triazol-4-yl-acetic acid (αHGlytrz), has been exploited to synthesize a structurally diverse and functionally intriguing metal-organic framew
Autor:
Isao Hirata, Kazuomi Suzuki, B. Van Meerbeek, Paul Lambrechts, Johan Snauwaert, Yasuhiro Yoshida, K.L. Van Landuyt, Masayuki Okazaki, J. De Munck
Publikováno v:
Journal of Dental Research. 87:757-761
Functional monomers in adhesive systems can improve bonding by enhancing wetting and demineralization, and by chemical bonding to calcium. This study tested the hypothesis that small changes in the chemical structure of functional monomers may improv
Autor:
Joris Winderickx, Johan Snauwaert, Thomas Vanhelmont, Stefaan Wera, D. Terwel, Katleen Lemaire, Peter Borghgraef, T. Vandebroek, Fred Van Leuven
Publikováno v:
Biochemistry. 44:11466-11475
Hyperphosphorylation and aggregation of protein tau are typical for neurodegenerative tauopathies, including Alzheimer's disease (AD). We demonstrate here that human tau expressed in yeast acquired pathological phosphoepitopes, assumed a pathological
Autor:
Alexander Volodin, Johan Snauwaert, Katleen Boussu, C. Van Haesendonck, Carlo Vandecasteele, B. Van der Bruggen
Publikováno v:
Journal of Colloid and Interface Science. 286:632-638
Determination of the surface roughness by AFM is crucial to the study of particle fouling in nanofiltration. It is, however, very difficult to compare the different roughness values reported in the literature because of a lack in uniformity in the me
Autor:
Paul Lambrechts, Kazuomi Suzuki, Satoshi Inoue, Marleen Peumans, B. Van Meerbeek, André Poitevin, J. De Munck, Johan Snauwaert, Yasuhiro Yoshida, Eduardo Coutinho, K.L. Van Landuyt
Publikováno v:
Journal of Dental Research. 84:183-188
One-step adhesives bond less effectively to enamel/dentin than do their multi-step versions. To investigate whether this might be due to phase separation between adhesive ingredients, we characterized the interaction of 5 experimental and 3 commercia
Autor:
Christian Van Haesendonck, Peter Lievens, N. Vandamme, Ewald Janssens, Johan Snauwaert, Erno Vandeweert
Publikováno v:
Surface Science. 558:57-64
Tapping mode atomic force microscopy (TM-AFM) was used to characterize individual gold clusters deposited on a 1,4-benzenedimethanethiol layer. Au n ( n =1–500) clusters were produced with a laser vaporization source and deposited with low kinetic
Autor:
André Persoons, Karen E. S. Phillips, Bertrand Busson, Thierry Verbiest, Thomas J. Katz, Colin Nuckolls, Louis Hellemans, Johan Snauwaert, S. Van Elshocht, Martti Kauranen
Publikováno v:
Tampere University
We study second-order nonlinear optical properties of Langmuir–Blodgett films of two chiral helicenebisquinones. We compare the second harmonic efficiency of both materials and we demonstrate that the second harmonic signal generated by a Langmuir
Publikováno v:
Carbohydrate Polymers. 39:231-235
Pressure-induced gelation of six different starch types has been followed by Fourier-transform infrared (FTIR) spectroscopy. The diamond anvil cell allowed us to follow changes in situ at high pressure. Changes in the infrared spectrum due to conform
Autor:
Alica Rosová, Johan Snauwaert, B. Chenevier, A. Figueras, Karol Fröhlich, D. Machajdík, François Weiss, J Šouc
Publikováno v:
Acta Physica Polonica A. 92:255-258
Autor:
D. Quaeyhaegens, Trudo Clarysse, Marc D'olieslaeger, P. De Wolf, W. Vandervorst, Johan Snauwaert, Louis Hellemans
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 13:1699-1704
The determination of the spatial distribution of charge carriers in semiconducting structures with an atomic force microscope (AFM) is presented. This new technique is based on the measurement of the spreading resistance of a conducting AFM tip on a