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pro vyhledávání: '"Joey Chiao-Yi Huang"'
Autor:
Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Joey Chiao-Yi Huang, Chin-Hao Chang
Publikováno v:
Sensors, Vol 23, Iss 18, p 7959 (2023)
In this work, the degradation of the random telegraph noise (RTN) and the threshold voltage (Vt) shift of an 8.3Mpixel stacked CMOS image sensor (CIS) under hot carrier injection (HCI) stress are investigated. We report for the first time the signifi
Externí odkaz:
https://doaj.org/article/c06690f3ebe8457bbca1d30d25a46465
