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pro vyhledávání: '"Joel Elizondo Martinez"'
Publikováno v:
International Symposium on Microelectronics. 2021:000256-000259
K&S developed and tested the Advanced Process Diagnostics (APD) algorithm to classify bonding outliers in ultrasonic wire bond production. APD is a software feature, part of Kulicke & Soffa wedge bonders to measure and analyze process signals and det
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abe2678024e727f3da54f22340cbf42b
https://doi.org/10.4071/1085-8024-2021.1.000256
https://doi.org/10.4071/1085-8024-2021.1.000256
Publikováno v:
Advancing Microelectronics; Jul/Aug2022, Vol. 49 Issue 4, p12-15, 4p