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pro vyhledávání: '"Joe Xiao"'
Autor:
Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Chee-Wah Ho, Min-Jian Yang, Nidhi Agrawal, Joe Xiao, Vijayakumar Thangamariappan, Keith Schaub, Ira Leventhal, Constantinos Xanthopoulos
Publikováno v:
ITC
The paper will demonstrate the application of Deep Learning (DL) for the detection of defective tester sockets. The proposed methodology relies on images like those used for manual or rule-based inspection, commonly collected using Automated Optical
Publikováno v:
2013 6th International IEEE/EMBS Conference on Neural Engineering (NER).
Deep brain stimulation (DBS) leads with radially-segmented contacts are an enabling technology to more precisely sculpt neuronal activation and potentially improve clinical outcomes for patients with a number of brain disorders. In this study, we dev