Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Joe Sarmiento"'
Autor:
Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Kaushik Narayanun, Shantanu Sarangi, Francisco Da Silva, Joe Sarmiento, Smbat Tonoyan, Ashwin Chintaluri, Animesh Khare, Milind Sonawane, Ashish Kumar, Anitha Kalva, Alex Hsu, Jayesh Pandey
Publikováno v:
2022 IEEE 40th VLSI Test Symposium (VTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8363c45c201b9caa44d71a5134b4a81d
https://doi.org/10.1109/vts52500.2021.9794146
https://doi.org/10.1109/vts52500.2021.9794146
Publikováno v:
International Symposium for Testing and Failure Analysis.
Driven by the need for higher test-compression, increasingly many chip-makers are adopting new DFT architectures such as “Extreme-Compression” (XTR, supported by Synopsys) with on-chip pattern generation and MISR based compression of chain output
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::26614fb46a4d2069cb9a774519ad79bc
https://doi.org/10.31399/asm.cp.istfa2016p0051
https://doi.org/10.31399/asm.cp.istfa2016p0051
Publikováno v:
Log Newspaper; 6/3/2016, Issue 1025, p45-45, 1/4p
Publikováno v:
Log Newspaper; 8/14/2015, Issue 1004, p32-32, 1/2p
Publikováno v:
Log Newspaper; 8/14/2015, Issue 1004, p32-32, 1/6p
Publikováno v:
Log Newspaper; 9/26/2014, Issue 981, p38-38, 1/2p