Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jochen Wittge"'
Autor:
Brian K. Tanner, David Allen, Jochen Wittge, Andreas N. Danilewsky, Jorge Garagorri, Eider Gorostegui-Colinas, M. Reyes Elizalde, Patrick J. McNally
Publikováno v:
Crystals, Vol 7, Iss 11, p 347 (2017)
The crack geometry and associated strain field around Berkovich and Vickers indents on silicon have been studied by X-ray diffraction imaging and micro-Raman spectroscopy scanning. The techniques are complementary; the Raman data come from within a f
Externí odkaz:
https://doaj.org/article/0c80f2efb40d40a9b98f046bdd099f78
Autor:
Jennifer Stopford, Arthur Henry, Dionysios Manessis, Nick Bennett, Ken Horan, David Allen, Jochen Wittge, Lars Boettcher, Aidan Cowley, Patrick McNally
Publikováno v:
Scopus-Elsevier
Heriot-Watt University
Heriot-Watt University
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::08d7112fd01cc1851e01a1b9105c3e11
http://www.scopus.com/inward/record.url?eid=2-s2.0-84857569141&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-84857569141&partnerID=MN8TOARS
