Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Joachim J. Krueger"'
Autor:
Christophe P. Kocot, Myrna S. Mayonte, Yong Luo, Aanand Krishnan, Joachim J. Krueger, Ningxia Tan, Robert W. Herrick, Scott A. McHugo, Tim Osentowski, Mike Heidecker, Qing Deng, Suning Xie, Mark R. Keever, David Eastley
Publikováno v:
SPIE Proceedings.
Oxide VCSELs are the emitter of choice for high-speed optical communication applications. A low divergence circular beam, wafer-level testing and the capability to create dense two-dimensional arrays provide the VCSEL with unique advantages over edge
Autor:
Mark R. Keever, Ningxia Tan, Mike Heidecker, Joachim J. Krueger, Reena Sabharwal, Kimanh Nguyen, Scott A. McHugo, Christopher Palo Alto Kocot, David Eastley, Myrna S. Mayonte, Naginder Janda
Publikováno v:
SPIE Proceedings.
Electrostatic Discharge (ESD) damage is considered to be the leading cause for IC field failures. With increasing integration densities, devices tend to become more and more sensitive to ESD events. This observation holds in particular true for 850nm
Autor:
Greg Niven, Neil McKinnon, Renata Carico, Mitch Jansen, Rene Dato, James Dudley, Aram Mooradian, Jurgen Hofler, Arvydas Umbrasas, Frank Hu, Glen P. Carey, Chris Kocot, Sui Lim, Joachim J. Krueger, Sascha Hallstein, Ashish Tandon, Yae Okuno, Giorgio Giaretta
Publikováno v:
Journal of the Society for Information Display. 15:805
— High-power red, green, and blue laser light sources made from vertically emitting arrays of intracavity doubled IR lasers is reported. The emitted infrared light from a monolithic array of large-aperture vertical cavity lasers is converted into v
Autor:
Krueger J; Department of Psychology, Brown University, Providence, Rhode Island 02912, USA. Joachim_Krueger@Brown.edu, Mueller RA
Publikováno v:
Journal of personality and social psychology [J Pers Soc Psychol] 2002 Feb; Vol. 82 (2), pp. 180-8.
Autor:
Krueger J; Department of Psychology, Brown University, Box 1853, Providence, RI 02912, USA. joachim_krueger@brown.edu
Publikováno v:
The American psychologist [Am Psychol] 2002 Jan; Vol. 57 (1), pp. 70-1.