International intercomparison of scanning tunneling microscopy.

Autor: Barbato, G., Carneiro, K., Cuppini, D., Garnaes, J., Gori, G., Hughes, G., Jensen, C. P., Jo\rgensen, J. F., Jusko, O., Livi, S., McQuoid, H., Nielsen, L., Picotto, G. B., Wilkening, G.

Publikováno v: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p1531-1535, 5p

Hysteresis correction of scanning tunneling microscope images.

Autor: Jo\rgensen, J. F., Carneiro, K., Madsen, L. L., Conradsen, Knut

Publikováno v: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1994, Vol. 12 Issue 3, p1702-1704, 3p