Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Jiusi Zhang"'
Publikováno v:
IEEE Transactions on Industrial Electronics. 70:9474-9482
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3320e7e4c006291a07f0f3cd9df8761f
https://doi.org/10.1109/tie.2022.3215823
https://doi.org/10.1109/tie.2022.3215823
Publikováno v:
IEEE/ASME Transactions on Mechatronics. 28:632-643
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7d9a02a59cbc7bf077fd0943f15a428
https://doi.org/10.1109/tmech.2022.3202642
https://doi.org/10.1109/tmech.2022.3202642
Publikováno v:
Brain Sciences, Vol 12, Iss 6, p 697 (2022)
Tic disorders are neurological disorders that are prone to fluctuation and recurrence. It is important to study the factors related to disease recurrence and to subsequently provide suggestions for clinical treatment. A retrospective study was conduc
Externí odkaz:
https://doaj.org/article/cc2080e6139246c8b6c0b4ed98aa1a40
Autor:
Jiusi Zhang, Jilun Tian, Abraham M. Alcaide, Jose I. Leon, Sergio Vazquez, Leopoldo G. Franquelo, Hao Luo, Shen Yin
Publikováno v:
IEEE Transactions on Power Electronics. :1-12
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0be8da195baad73c469399d49221c6e0
https://doi.org/10.1109/tpel.2023.3275791
https://doi.org/10.1109/tpel.2023.3275791
Publikováno v:
IEEE Transactions on Neural Networks and Learning Systems. :1-12
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e49b204c10ee135c9a9edc7a2207a4f3
https://doi.org/10.1109/tnnls.2022.3232147
https://doi.org/10.1109/tnnls.2022.3232147
Autor:
Leopoldo Garcia Franquelo, Minglei Li, Shen Yin, Jiusi Zhang, Jilun Tian, Jose I. Leon, Hao Luo
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 72:1-12
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f425cc4947d80af3ac3c6dcde78cf16
https://doi.org/10.1109/tim.2022.3227956
https://doi.org/10.1109/tim.2022.3227956
Publikováno v:
IEEE Transactions on Industrial Informatics. :1-11
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e638597881293f05947be7fa496d7211
https://doi.org/10.1109/tii.2023.3266403
https://doi.org/10.1109/tii.2023.3266403
Publikováno v:
Current Chinese Science. 2:243-251
Background: Through the analysis of the relevant data of industrial equipment, faults diagnosis is helpful for system maintenance and reducing economic losses. Objective: The aim is to reduce the influence of irrelevant features and efficiently train
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c95cd4e861ba050323d7764b713e1b0
https://doi.org/10.2174/2210298102666220318100051
https://doi.org/10.2174/2210298102666220318100051
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 71:1-12
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41804174239a2d41d3868b73ff9ab58b
https://doi.org/10.1109/tim.2022.3190025
https://doi.org/10.1109/tim.2022.3190025
Publikováno v:
2022 IEEE International Conference on Industrial Technology (ICIT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d279177da1773fd61155842380a5b984
https://doi.org/10.1109/icit48603.2022.10002811
https://doi.org/10.1109/icit48603.2022.10002811