Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Jithendra P R Nayak"'
Publikováno v:
International Journal of Software Innovation. 10:1-13
Each electronic device includes printed circuit boards (PCBs), where defect detection is an important process to enhance the quality of PCB production. To accomplish error-free PCBs, the researchers and experts converted traditional manual inspection
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::463239daca2fe80d756c9a34a7f99d66
https://doi.org/10.4018/ijsi.309726
https://doi.org/10.4018/ijsi.309726
Autor:
Jithendra P R Nayak, Vasu . S
Publikováno v:
International Journal of Engineering Research and Advanced Technology. 5:22-26
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6d6d514a5688889ce081125f689352fa
https://doi.org/10.31695/ijerat.2019.3456
https://doi.org/10.31695/ijerat.2019.3456
Autor:
Rajashekarappa, Reshma Banu, A. C. Nuthan, K. M. Sunjiv Soyjaudah, Jithendra P. R. Nayak, B. D. Parameshachari
Publikováno v:
2017 International Conference on Electrical, Electronics, Communication, Computer, and Optimization Techniques (ICEECCOT).
The aim of this paper is to develop a more accurate PCB inspection system. In this method captured colored images are natural images i.e. without any precustomized environment and hence the every time the capture images varies with lighting condition
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3055e0d9e610610138d574fb233965eb
https://doi.org/10.1109/iceeccot.2017.8284602
https://doi.org/10.1109/iceeccot.2017.8284602
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 225:012244
The importance of the Printed Circuit Board inspection process has been magnified by requirements of the modern manufacturing environment where delivery of 100% defect free PCBs is the expectation. To meet such expectations, identifying various defec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::704a9b8e82d46a2f2fb9a63cf58d3cec
https://doi.org/10.1088/1757-899x/225/1/012244
https://doi.org/10.1088/1757-899x/225/1/012244
Autor:
KUMAR, VIJAY1 vijay.kumar@sit.iitd.ac.in, PAUL, KOLIN1 kolin@cse.iitd.ac.in
Publikováno v:
ACM Computing Surveys. 2023 Suppl14s, Vol. 55, p1-41. 41p.