Zobrazeno 1 - 10
of 91
pro vyhledávání: '"Jinsheng Luo"'
Publikováno v:
International Conference on Cloud Computing, Performance Computing, and Deep Learning (CCPCDL 2022).
Publikováno v:
Traitement du Signal. 38:1253-1257
The current target tracking and detection algorithms often have mistakes and omissions when the target is occluded or small. To overcome the defects, this paper integrates bi-directional feature pyramid network (BiFPN) into cascade region-based convo
Publikováno v:
In Microelectronics Journal February 2004 35(2):145-149
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 20:1218-1225
Ideas for using the boundary element method (BEM) with the concept of critical electric field for simulation of high-voltage junction termination are introduced. Approaches for dealing with interface charges, depleted regions, and metal field plates
Publikováno v:
Chinese Science Bulletin. 42:374-377
A variable-capacitance model suitable for MMIC active voltage-controlled filter has been reported. The analytical expression is also given for the gate capacitance as a function of the gate bias. Since the free carrier move in active region for contr
Publikováno v:
Chinese Physics Letters. 10:433-436
We present distinct evidence of anticrossing behavior for excitonic transitions due to resonant coupling of heavy-hole ground levels in a biased GaAs/Al0.35Ga0.65As/GaAs (50/40/100 angstrom) asymmetric coupled-double-quantum-wells p-i-n structure by
Publikováno v:
Superlattices and Microstructures. 12:231-235
The excitation power dependence of nonresonant tunneling rates for photogenerated carriers is studied in a GaAs/Al 0.35 Ga 0.65 As/GaAs (50A/40A/100A) asymmetric double quantum well p-i-n structure by photoluminescence (PL) measurement. It is found t
Autor:
Jinsheng Luo, Wenhong Li
Publikováno v:
1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105).
In this paper, a novel analytical physical model for a thin film SOI RESURF structure is developed, based on the 2D Poisson equation, and the influence of the field SiO/sub 2/ interface charge is considered. The thin film SOI RESURF structure is anal
Publikováno v:
1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105).
An AlN film has been deposited by d.c. magnetron reactive sputtering. The stoichiometry, dielectric constant, breakdown strength, density, refractive index and stress of the films were measured. The surface roughness of the AlN film was studied by at
Publikováno v:
Proceedings of 4th International Conference on Solid-State and IC Technology.
The hydrogenated nano-crystalline silicon films (nc-Si:H) were prepared by using the ultra-high vaccum PECVD system. The nc-Si:H films consist of a mass of nano-grains and a great deal of interfaces between grains. It was found that the room temperat