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pro vyhledávání: '"Jing, Chungguang"'
Autor:
Fu, Xuewen, Wang, Erdong, Zhao, Yubin, Liu, Ao, Montgomery, Eric, Gokhale, Vikrant J., Gorman, Jason J., Jing, Chungguang, Lau, June W., Zhu, Yimei
Integrating femtosecond (fs) lasers to electron microscopies has enabled direct imaging of transient structures and morphologies of materials in real time and space, namely, ultrafast electron microscopy (UEM). Here we report the development of a las
Externí odkaz:
http://arxiv.org/abs/2006.12211