Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Jincheng Hao"'
Publikováno v:
BMC Oral Health, Vol 24, Iss 1, Pp 1-11 (2024)
Abstract Background With the development and utilization of three-dimensional (3D) intraoral scanning (IOS) technology, the morphological characteristics of teeth were quantitatively assessed. In this research, we aimed to explore the prevalence of d
Externí odkaz:
https://doaj.org/article/5048569a2c734de88df358f44b42e2ca
A simple route to synthesize size-controlled Ag(2)S core-shell nanocrystals, and their self-assembly
Publikováno v:
Nanotechnology. 19(22)
Silver sulfide (Ag(2)S) nanocrystals were successfully synthesized by the thermal treatment of the single source precursors, silver dialkyldithiophosphates (Ag[S(2)P(OC(n)H(2n+1))(2)]), under mild reaction conditions. The size of Ag(2)S nanocrystals
Publikováno v:
Nanotechnology; Jun2008, Vol. 19 Issue 22, p5607-25607, 1p
Autor:
Xing, Jixia1 (AUTHOR), Chen, Xi1 (AUTHOR) chenxiOL@yeah.net, Hao, Jincheng1 (AUTHOR), Zhang, Rongxin2 (AUTHOR), Hu, Mengjie2 (AUTHOR)
Publikováno v:
Photodermatology, Photoimmunology & Photomedicine. Nov2021, Vol. 37 Issue 6, p539-540. 2p.
Autor:
Zhang, Yachao, Li, Yifan, Wang, Jia, Shen, Yiming, Du, Lin, Li, Yao, Wang, Zhizhe, Xu, Shengrui, Zhang, Jincheng, Hao, Yue
Publikováno v:
Nanoscale Research Letters; 5/20/2020, Vol. 15 Issue 1, p1-7, 7p
Publikováno v:
Journal of Xinyang Normal University Natural Science Edition; Jan2020, Vol. 33 Issue 1, p1-8, 8p
Autor:
Zhen, Yang, Jinyan, Wang, Zhe, Xu, Xiaoping, Li, Bo, Zhang, Maojun, Wang, Min, Yu, Jincheng, Zhang, Xiaohua, Ma, Yongbing, Li
Publikováno v:
Journal of Semiconductors; Jan2014, Vol. 35 Issue 1, p014007-014011, 5p
Publikováno v:
Journal of Semiconductors; May2016, Vol. 37 Issue 5, p1-1, 1p
Publikováno v:
Proceedings 7th International Conference on Solid-State & Integrated Circuits Technology, 2004; 2004, p2317-2317, 1p
A better hot-carrier-induced degradation monitor for several typical device parameters of pMOSFET's.
Publikováno v:
2001 6th International Conference on Solid-State & Integrated Circuit Technology. Proceedings (Cat. No.01EX443); 2001, p1017-1017, 1p