Zobrazeno 1 - 10
of 79
pro vyhledávání: '"Jin-Seok Chung"'
Autor:
Ahyoung Kim, Soo Yeon Lim, Jung Hyun Park, Jin-Seok Chung, Hyeonsik Cheong, Changhyun Ko, Jong-Gul Yoon, Sang Mo Yang
Publikováno v:
RSC Advances. 12:23039-23047
We investigated temperature-dependent nanoscale conduction in an epitaxial VO2 film grown on an Al2O3 substrate using conductive-atomic force microscopy and deep data analysis.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9c50dcefb93a0596c2c109dfe2d6767
https://doi.org/10.1039/d2ra02803d
https://doi.org/10.1039/d2ra02803d
Publikováno v:
Current Applied Physics. 20:1185-1189
Understanding ferroelectric domain switching dynamics at the nanoscale is a great of importance in the viewpoints of fundamental physics and technological applications. Here, we investigated the intriguing polarity-dependent switching dynamics of fer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c3306eac9981668b6cebea0854113e2
https://doi.org/10.1016/j.cap.2020.07.017
https://doi.org/10.1016/j.cap.2020.07.017
Autor:
Bo Wang, Sang Mo Yang, Saikat Das, Long Qing Chen, Seung Chul Chae, Jin Seok Chung, Tae Won Noh, Sung Min Park, Jong-Gul Yoon
Publikováno v:
Nature Nanotechnology. 13:366-370
Flexoelectricity is an electromechanical coupling between electrical polarization and a strain gradient 1 that enables mechanical manipulation of polarization without applying an electrical bias2,3. Recently, flexoelectricity was directly demonstrate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a5678faa77d534ec41354613d635532b
https://doi.org/10.1038/s41565-018-0083-5
https://doi.org/10.1038/s41565-018-0083-5
Autor:
Sang Mo Yang, Jinkwon Kim, Han Gyeol Lee, Jin-Seok Chung, Sang-Min Lee, Sang Hwa Park, Junsik Mun, Tae Won Noh, Ji Hye Lee, Tae Heon Kim, Seo Hyoung Chang, Suk Bum Chung, Miyoung Kim, Eun Kyo Ko
Publikováno v:
Advanced Electronic Materials. 8:2100804
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75b48ecdbfba50eb08d680f670ed6522
https://doi.org/10.1002/aelm.202100804
https://doi.org/10.1002/aelm.202100804
Autor:
Seo Hyoung Chang, Miyoung Kim, Yoonkoo Kim, Sang Mo Yang, Yeong Jae Shin, Lingfei Wang, Jin-Seok Chung, Daesu Lee, Tae Won Noh, Jeong Rae Kim, Ho-Hyun Nahm, Jong-Gul Yoon
Publikováno v:
ACS Applied Materials & Interfaces. 9:27305-27312
With recent trends on miniaturizing oxide-based devices, the need for atomic-scale control of surface/interface structures by pulsed laser deposition (PLD) has increased. In particular, realizing uniform atomic termination at the surface/interface is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0890bef86b6abf51547bd85adafac3f1
https://doi.org/10.1021/acsami.7b07813
https://doi.org/10.1021/acsami.7b07813
Autor:
Junghyun Park, Jin Kuk Yang, Sungkyun Park, Y.S. Lee, Bong Ko, Young Jun Chang, Jin-Seok Chung, Hyuk Kim, Jiwoong Kim, Miru Noh
Publikováno v:
Current Applied Physics. 16:1576-1580
By using the spectroscopic ellipsometric technique, we investigated the excimer laser annealing (ELA) effect on the electronic properties of indium tin oxides (ITO) films fabricated by the DC-sputtering method, which is the one of the most commonly k
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a0b7a83f763cfc4c6ffc172c9351c96
https://doi.org/10.1016/j.cap.2016.09.010
https://doi.org/10.1016/j.cap.2016.09.010
Synchrotron X-ray microdiffraction of Fe–3 wt%Si steel focusing on sub-boundaries within Goss grains
Autor:
Hyung-Seok Shim, Kyehwan Gil, Soo-Bin Kwon, Jin-Seok Chung, Jong-Tae Park, Tae-Wook Na, Nong-Moon Hwang
Publikováno v:
Scripta Materialia. 116:71-75
The microstructure evolved after the initial stage of abnormal grain growth (AGG) in Fe–3 wt%Si steel was examined using synchrotron X-ray microdiffraction to identify the sub-boundaries, which had been suggested to induce the selective AGG of Goss
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::161266e54e636917792b583b096b7843
https://doi.org/10.1016/j.scriptamat.2016.01.026
https://doi.org/10.1016/j.scriptamat.2016.01.026
Autor:
Miru Noh, Young Jun Chang, Yongseok Lee, Min Gyu Kang, Jin-Seok Chung, Hyuk Kim, Jung-Hun Park, Il Wan Seo, Junghyun Park, Chong Yun Kang
Publikováno v:
Current Applied Physics. 16:145-149
We report on the effect of the excimer laser annealing on the electronic properties of indium tin oxide (ITO) sol–gel films by using spectroscopic ellipsometric technique. We found that the excimer laser annealing effectively induces the crystalliz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2af1817d6b4d854dd1988440c57fdfca
https://doi.org/10.1016/j.cap.2015.11.007
https://doi.org/10.1016/j.cap.2015.11.007
Autor:
Muhammad Sheeraz, Wei Peng, Lingfei Wang, Kui Yao, Bo Wang, Jin Seok Chung, Jun Pan, Chang Won Ahn, Long Qing Chen, Kun Guo, Jacob A. Zorn, Tae Heon Kim, Tae Won Noh, Chang Jae Roh, Yaping Zhang, Jong Seok Lee, Junsik Mun, Miyoung Kim
Publikováno v:
Advanced Functional Materials. 30:1910569
J.A.Z. and J.M. contributed equally to this work. This work was supported by the Research Center Program of IBS (Institute for Basic Science) in Korea (IBS-R009-D1). STEM measurement was supported by the National Center for Inter-University Research
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0081b6559121483fb013d8fd05b1680
https://doi.org/10.1002/adfm.201910569
https://doi.org/10.1002/adfm.201910569
Autor:
Yeong Jae, Shin, Lingfei, Wang, Yoonkoo, Kim, Ho-Hyun, Nahm, Daesu, Lee, Jeong Rae, Kim, Sang Mo, Yang, Jong-Gul, Yoon, Jin-Seok, Chung, Miyoung, Kim, Seo Hyoung, Chang, Tae Won, Noh
Publikováno v:
ACS applied materialsinterfaces. 9(32)
With recent trends on miniaturizing oxide-based devices, the need for atomic-scale control of surface/interface structures by pulsed laser deposition (PLD) has increased. In particular, realizing uniform atomic termination at the surface/interface is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::5817988c81914c3f8cee4f8141f8ff3d
https://pubmed.ncbi.nlm.nih.gov/28731326
https://pubmed.ncbi.nlm.nih.gov/28731326