Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jim Vitarelli"'
Autor:
Jesus O. Mares, Christopher D. Molek, Matthew Stuthers, Eric James Welle, D. Barrett Hardin, Jim Vitarelli
Publikováno v:
Propellants, Explosives, Pyrotechnics. 45:236-242
Autor:
D. Barrett Hardin, Matthew Stuthers, Jim Vitarelli, Christopher D. Molek, Eric James Welle, Jesus O. Mares
Publikováno v:
Propellants, Explosives, Pyrotechnics. 45:162-162
Autor:
Jim Vitarelli, Phillip E. Russell
Publikováno v:
Microelectronic Engineering. 24:221-232
The ability to resolve sub-nanosecond phase shifts on internal IC nodes is central to the utility of electron beam test systems. In this work, the obtainable time delay resolution has been investigated both experimentally and via computer modeling. I
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 50:1680-1681
The rapid advance of IC design and fabrication technology is imposing increasing demands on the performance of electron beam testers and voltage contrast techniques. One industry survey predicts that the minimum feature size on IC's will be 0.1 μm b