Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Jim Vickers"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
Lock-in thermography (LIT) phase data is used to generate phase shift versus applied lock-in frequency plots to estimate defect depth in semiconductor packages. Typically, samples need to be tested for an extended time to ensure data consistency. Fur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfc37f277fa3fe1683a4aa0db58f5d39
https://doi.org/10.31399/asm.cp.istfa2018p0017
https://doi.org/10.31399/asm.cp.istfa2018p0017
Publikováno v:
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
This paper describes a 2X improvement in phase data acquisition for Lock-in Thermography (LIT). Phase data is used to generate phase shift versus applied lock-in frequency plots to estimate defect depth in semiconductor packages. Typically, samples n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f477afc3d3d616e511c814ffba1a3fa
https://doi.org/10.1109/ipfa.2018.8452169
https://doi.org/10.1109/ipfa.2018.8452169
Publikováno v:
Proceedings of the Water Environment Federation. 2015:6090-6101
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13e0dcf001e1ae64c3258ff93adec3e5
https://doi.org/10.2175/193864715819540540
https://doi.org/10.2175/193864715819540540
Publikováno v:
International Symposium for Testing and Failure Analysis.
Laser Voltage Imaging (LVI) has become a well-established method for isolating scan-shift (i.e., scan chain integrity) tests failures [1, 2]. When LVI is coupled with time-domain information acquired using Continuous-Wave Laser Voltage Probing (CW-LV
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1130ddd712ece822a8cda0c5727e9780
https://doi.org/10.31399/asm.cp.istfa2013p0322
https://doi.org/10.31399/asm.cp.istfa2013p0322
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper we evaluate the possibility of extending Time Resolved Emission (TRE) technology towards future low voltage SOI technologies. In particular, we investigate and quantify the gain offered by the InGaAs detector improvements devised by Cre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a67b5966559bfdc22f0c995c6e0bdf19
https://doi.org/10.31399/asm.cp.istfa2008p0407
https://doi.org/10.31399/asm.cp.istfa2008p0407
Autor:
Jim Vickers, Radu Ispasoiu, Chi-Lin Young, Paul Ng, Dan Cotton, Francisco Contreras, Chris Shaw
Publikováno v:
International Symposium for Testing and Failure Analysis.
Ultra low voltage probing by time resolved emission (TRE) technology below 1.0V is very challenging for micro-processor debug in practical operation condition. This is because the photo-emission rate reduces exponentially as the power supply voltage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74d08fd8d720fef8309f36cdda38cee0
https://doi.org/10.31399/asm.cp.istfa2007p0161
https://doi.org/10.31399/asm.cp.istfa2007p0161
Autor:
Jim Vickers, Dan J. Bodoh, Ed Black, Kris Dickson, Dan Cotton, Birk Lee, Ron Wang, Nader Pakdaman, Tim Cheng
Publikováno v:
International Symposium for Testing and Failure Analysis.
Time-resolved photon emission has been shown to be useful in analyzing clock skews and timing-related defects in flip-chip devices. In practice, time-resolved photon emission using the S-25 Quantar detector cannot be used at long loop lengths (typica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dabd00b4f51d5022d8114f49310f490
https://doi.org/10.31399/asm.cp.istfa2002p0655
https://doi.org/10.31399/asm.cp.istfa2002p0655
Publikováno v:
International Symposium for Testing and Failure Analysis.
Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and comp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16a216a26b36a54f53df8579624e8a43
https://doi.org/10.31399/asm.cp.istfa2002p0645
https://doi.org/10.31399/asm.cp.istfa2002p0645