Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Jim Dewitt"'
Autor:
Suhas Pillai, Jun Yashima, Aki Fujimura, Thang Nguyen, Ajay Baranwal, Noriaki Nakayamada, Jim Dewitt
Publikováno v:
Photomask Technology 2021.
The two standard reticle defect inspection methods are die-to-die and die-to-database. The die-to-die inspection method compares images from the two dice on the same reticle to identify any defect. However, the die-to-database inspection method compa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7d1eadfefdbd187ed1642a6a88c6d0a
https://doi.org/10.1117/12.2601004
https://doi.org/10.1117/12.2601004
Autor:
Ajay K. Baranwal, Suhas Pillai, Thang Nguyen, Jun Yashima, Jim Dewitt, Noriaki Nakayamada, Mikael Wahlsten, Aki Fujimura
Publikováno v:
Photomask Japan 2021: XXVII Symposium on Photomask and Next-Generation Lithography Mask Technology.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce5eada4edd2398f4834de7c3b01b9cc
https://doi.org/10.1117/12.2601856
https://doi.org/10.1117/12.2601856
Autor:
Aki Fujimura, Noriaki Nakayamada, Ajay Baranwal, Jim Dewitt, Mikael L. Wahlsten, Thang Nguyen, Suhas Pillai, Jun Yashima
Publikováno v:
Photomask Technology 2020.
Sub-nanometer accuracy attainable with electron micrograph SEM images is the only way to “see” well enough for the mask analysis needed in EUV mask production. Because SEM images are pixel dose maps, deep learning (DL) offers an attractive altern
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e7d2a145d767530b74adf232d64c5b8
https://doi.org/10.1117/12.2576431
https://doi.org/10.1117/12.2576431
Autor:
Jim DeWitt Isaak
Publikováno v:
Proceedings of the IEEE. 101:1810-1812
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29e950aff5184c6692df70818278b4f8
https://doi.org/10.1109/jproc.2013.2266462
https://doi.org/10.1109/jproc.2013.2266462
Publikováno v:
Journal of Physical Education, Recreation & Dance. 68:49-52
(1997). Swim Test Requirements at Four-Year Universities in the United States. Journal of Physical Education, Recreation & Dance: Vol. 68, No. 2, pp. 49-52.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea5c56b7ea953325ec722969a24dc15e
https://doi.org/10.1080/07303084.1997.10604896
https://doi.org/10.1080/07303084.1997.10604896
Publikováno v:
Journal of Physical Education, Recreation & Dance. 63:73-79
Rock climbing is a vigorous activity that requires a unique combination of strength and power balanced with endurance and flexibility. In the mind of a dedicated rock climber, developing and maintaining an adequate level of fitness is as important as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb2900117694c2c88050a7d07e3c769f
https://doi.org/10.1080/07303084.1992.10604140
https://doi.org/10.1080/07303084.1992.10604140
Autor:
Tom Roberts, Jim Dewitt
Publikováno v:
Journal of Physical Education, Recreation & Dance. 62:67-71
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::039682278907a0bd2648d60b9a8f8ae4
https://doi.org/10.1080/07303084.1991.10604006
https://doi.org/10.1080/07303084.1991.10604006
Publikováno v:
SPIE Proceedings.
Multiphase printing (MPPTM) has been shown to improve registration and CD performance by reducing butting errors, averaging scan linearity errors and improving stripe boundary CD performance. In the MEBES 4500, improvements in the data path allow MPP
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65d36ce20c342ebabe1e0c0a16447758
https://doi.org/10.1117/12.262805
https://doi.org/10.1117/12.262805
Autor:
Robert J. Naber, William Wang, Michael D. Lubin, Leonard Gasiorek, Jim DeWitt, Joe Watson, Keith Wires, Thomas P. Coleman
Publikováno v:
SPIE Proceedings.
It has been shown that mask composite pattern position errors can be reduced by more than 40% on the MEBES 4000 system if a reference grid is used to match a MEBES 4000 system to an independent metrology tool. It has also been shown that matching bet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6250afdeeb661e054c61a5df608b0670
https://doi.org/10.1117/12.228172
https://doi.org/10.1117/12.228172
Autor:
David W. Alexander, Mark Mayse, Allen Cook, Jim DeWitt, Joe Watson, Wayne Phillips, Charles A. Sauer, Robert J. Naber, Leonard Gasiorek
Publikováno v:
SPIE Proceedings.
MEBES systems are characterized by constituent error performance, whereas masks produced on pattern generators are characterized by composite error performance. System evaluation by constituent specification is notable for the ease with which system
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91df627b41d0d1dbe759edf54e9c9324
https://doi.org/10.1117/12.228189
https://doi.org/10.1117/12.228189