Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jihan Standfest"'
Autor:
Ketul B. Sutaria, Minki Cho, Anisur Rahman, Jihan Standfest, Rahul Sharma, Swaroop Namalapuri, Shiv Gupta, Bahar Ajdari, Ricardo Ascazubi, Balkaran Gill
Publikováno v:
2022 IEEE International Reliability Physics Symposium (IRPS).
Autor:
Jeffery Hicks, Swaroop Kumar Namalapuri, S. Ramey, Jihan Standfest, A. H. Davoody, Balkaran Gill, P Supriya, T. Mutyala, Ketul B. Sutaria, Inanc Meric
Publikováno v:
IRPS
Circuit reliability is a significant concern in scaled technologies. Physical aging models derived by DC stress on discrete devices are accurate to an extent, but can be further improved by evaluating the behaviour of simple circuits such as ring osc