Zobrazeno 1 - 10
of 39
pro vyhledávání: '"Jih-Jong Wang"'
Autor:
John L. McCollum, Amal Zerrouki, Esmat Z. Hamdy, Jih-Jong Wang, Nadia Rezzak, Gregory Bakker, Alex Cai, Fengliang Xue, Frank Hawley, Michael Traas
Publikováno v:
IEEE Transactions on Nuclear Science. 65:64-70
RTG4 total ionizing dose (TID) tolerance is investigated postdynamic burn-in (DBI). A $V_{T}$ shift of the programmed Pflash cell is observed post-DBI and is due to programming voltage degradation resulting from the DAC aging. TID testing performed p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6aa09e2b4dc723a758a28995930ae0f
https://doi.org/10.1109/tns.2017.2768038
https://doi.org/10.1109/tns.2017.2768038
Publikováno v:
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8425f8efa0a38c74b504db6f688152d7
https://doi.org/10.1109/radecs47380.2019.9745684
https://doi.org/10.1109/radecs47380.2019.9745684
Publikováno v:
2019 IEEE Radiation Effects Data Workshop.
The single-event response of the RTG4 flash-based FPGA is characterized using 64 and 200 MeV proton sources. Several blocks are tested, including self-corrected triple module redundant (STMR) flip-flops with SET filter enabled and disabled, micro SRA
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1576c1efc737e485bfb49680a0f2d0e9
https://doi.org/10.1109/redw.2019.8906605
https://doi.org/10.1109/redw.2019.8906605
Combine Flash-Based FPGA TID and Long-Term Retention Reliabilities Through ${{\rm V}_{\rm T}}$ Shift
Autor:
Pavan Singaraju, James Yingbo Jia, Fengliang Xue, Jih-Jong Wang, Frank Hawley, Durwyn Dsilva, Salim Samiee, Nguyen Victor, Esmat Z. Hamdy, Nadia Rezzak
Publikováno v:
IEEE Transactions on Nuclear Science. 63:2129-2136
Reliability test results of data retention and total ionizing dose (TID) in 65 nm Flash-based field programmable gate array (FPGA) are presented. Long-chain inverter design is recommended for reliability evaluation because it is the worst case design
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abc46c9a6efdcdb6da7347137abc678c
https://doi.org/10.1109/tns.2016.2524692
https://doi.org/10.1109/tns.2016.2524692
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
The Single-Event response of Microsemi 28 nm PolarFire FPGA is characterized using neutron and 64 MeV proton sources. Single-Event Latchup (SEL), Single Event Upset (SEU) and Single Event Functional Interrupt (SEFI) results are presented.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9005e46acd8a7e2520b4505ae7041659
https://doi.org/10.1109/nsrec.2018.8584300
https://doi.org/10.1109/nsrec.2018.8584300
A Novel 65 nm Radiation Tolerant Flash Configuration Cell Used in RTG4 Field Programmable Gate Array
Autor:
James Yingbo Jia, Nadia Rezzak, Jih-Jong Wang, Esmat Z. Hamdy, Alex Cai, John L. McCollum, Frank Hawley, Durwyn Dsilva
Publikováno v:
IEEE Transactions on Nuclear Science. 62:3072-3079
The newly introduced radiation-tolerant flash-based FPGA, RTG4, uses a novel configuration cell design composed of a NMOS switch controlled by a totem pole p-channel flash and n-channel flash construction. Its radiation tolerance is far superior to t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83aabcc3d6f6e6941c2be7ab1fcf051b
https://doi.org/10.1109/tns.2015.2495262
https://doi.org/10.1109/tns.2015.2495262
Autor:
Jih-Jong Wang, Nadia Rezzak
Publikováno v:
IEEE Transactions on Nuclear Science. 62:1599-1608
In this work 3D-TCAD simulation is used to investigate and harden single event latch-up (SEL) occurring in embedded SRAMs, in both 130 nm and 65 nm Flash-based Field Programmable Gate Arrays (FPGAs). The methodology to perform accurate SEL simulation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed2e0214141d3be36f66ef0bc1cf3be2
https://doi.org/10.1109/tns.2015.2450210
https://doi.org/10.1109/tns.2015.2450210
Autor:
Frank Hawley, Salim Samiee, Esmat Z. Hamdy, Jih-Jong Wang, Nadia Rezzak, Nguyen Victor, Stephen Varela
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
In-beam programming of the first radiation-hardened Flash-based FPGA—RTG4 is investigated. Programming by commercially available FlashPro is performed under perpendicular heavy-ion irradiation with LET ranging from 1.2 to 30.5 MeV-cm2/mg. Although
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59764268061dbf463aa9038117f7516f
https://doi.org/10.1109/radecs.2017.8696174
https://doi.org/10.1109/radecs.2017.8696174
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper investigates and proves the use of xray testing as a methodology and/or complement for TID testing of flip-chip FPGAs to identify the most sensitive circuit. This testing methodology can be used to test any flip-chip FPGA, Flash-based and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ae85f52de1af4d494e5424b8183478a
https://doi.org/10.1109/radecs.2017.8696120
https://doi.org/10.1109/radecs.2017.8696120
Autor:
Durwyn Dsilva, Harvey Chen, Minh Nguyen, John L. McCollum, Stephen Varela, Jih-Jong Wang, Frank Hawley, Ken O'Neill, Nadia Rezzak, Sean Cui, Esmat Z. Hamdy
Publikováno v:
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The single event effects hardening and heavy-ion testing of a radiation-hardened Flash-based field programmable gate array, RTG4, are presented. The hardened logic circuits include fabric flip-flops, fabric SRAM, global clocks, PLL, and SERDES. SEL i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ea6d4d0df67cb8916dd1968baee5370
https://doi.org/10.1109/radecs.2016.8093207
https://doi.org/10.1109/radecs.2016.8093207