Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Jianyu Hong"'
Autor:
Xiaobo Hu, Youyang Wang, Yun Jia, Jianyu Hong, Tengfei Chen, Juanjuan Xue, Yuanjing Chen, Jiahua Tao, Guoen Weng, Shaoqiang Chen, Ziqiang Zhu, Junhao Chu
Publikováno v:
IEEE Access, Vol 8, Pp 112859-112866 (2020)
Electroluminescence (EL) images with absolute photon emissions from Cu(In, Ga)Se2 (CIGS) solar cells were obtained under different forward current injections, with the spatially distributed EL emission becoming non-uniform as the current density grad
Externí odkaz:
https://doaj.org/article/c2830086b49648c4b445cc3ed7b095ce
Autor:
Juanjuan Xue, Shaoqiang Chen, Jiahua Tao, Ziqiang Zhu, Tengfei Chen, Guoen Weng, Jianyu Hong, Yun Jia, Yuanjing Chen, Youyang Wang, Junhao Chu, Xiaobo Hu
Publikováno v:
IEEE Access, Vol 8, Pp 112859-112866 (2020)
Electroluminescence (EL) images with absolute photon emissions from Cu(In, Ga)Se2 (CIGS) solar cells were obtained under different forward current injections, with the spatially distributed EL emission becoming non-uniform as the current density grad
Autor:
Junhao Chu, Guoen Weng, Hidefumi Akiyama, Youyang Wang, Xiaobo Hu, Shaoqiang Chen, Bo Zhang, Jianyu Hong, Yuanjing Chen, Yingbin Zhang
Publikováno v:
Progress in Photovoltaics: Research and Applications. 28:295-306
Publikováno v:
Energy. 174:85-90
A two-dimensional distributed resistance model has been used to simulate the measured dark current-voltage (J-V) curve and the absolute electroluminescence (EL) images of a GaAs solar cell, with the deviation between the simulated and experimental re
Autor:
Jianyu Hong, Youyang Wang, Yuanjing Chen, Xiaobo Hu, Guoen Weng, Shaoqiang Chen, Hidefumi Akiyama, Yingbin Zhang, Bo Zhang, Junhao Chu
Publikováno v:
Progress in Photovoltaics: Research and Applications. 28
Autor:
Youyang Wang, Jianyu Hong, Jinjia Xu, Sun Yifan, Yun Jia, Hidefumi Akiyama, Liying Li, Ziqiang Zhu, Junhao Chu, Xiaobo Hu, Xianjia Luo, Guoen Weng, Shaoqiang Chen
Publikováno v:
Energy. 229:120606
Current defect inspection methods for photovoltaic (PV) devices based on electroluminescence (EL) imaging technology lack juggling both labor-saving and in-depth understanding of defects, restricting the progress towards yield improvement and higher