Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Jiantai Wang"'
Publikováno v:
Applied Sciences, Vol 14, Iss 13, p 5813 (2024)
Kriging surrogate model has extracted extensive attention in reliability evaluation, owing to its excellent applicability and operability nowadays, which confronts with difficulties in balancing the efficiency and accuracy for complicated mechanical
Externí odkaz:
https://doaj.org/article/172c84daba6a4aee8b2115571d14b8b4
Autor:
Chan Guo, Zhangxu Pan, Changhao Li, Shenghan Zou, Chao Pang, Jiantai Wang, Jinhua Hu, Zheng Gong
Publikováno v:
npj Flexible Electronics, Vol 6, Iss 1, Pp 1-13 (2022)
Abstract Large-area, programmable assembly of diverse micro-objects onto arbitrary substrates is a fundamental yet challenging task. Herein a simple wafer-level micro-assembly technique based on the light-triggered change in both surface topography a
Externí odkaz:
https://doaj.org/article/e5779603085d4c0bb25b3ac1aee40039
Autor:
Quantong Li, Albert Minj, Yunzhi Ling, Changan Wang, Siliang He, Xiaoming Ge, Chenguang He, Chan Guo, Jiantai Wang, Yuan Bao, Zhuming Liu, Pierre Ruterana
Publikováno v:
Crystals, Vol 13, Iss 7, p 1027 (2023)
We have investigated the interface dislocations in InxGa1−xN/GaN heterostructures (0 ≤ x ≤ 0.20) using diffraction contrast analysis in a transmission electron microscope. The results indicate that the structural properties of interface disloca
Externí odkaz:
https://doaj.org/article/097b6cc4624a4b9387c9688e5dbcff41
Autor:
Shiben Hu, Kuankuan Lu, Honglong Ning, Rihui Yao, Yanfen Gong, Zhangxu Pan, Chan Guo, Jiantai Wang, Chao Pang, Zheng Gong, Junbiao Peng
Publikováno v:
Nanomaterials, Vol 11, Iss 2, p 522 (2021)
In this work, we performed a systematic study of the physical properties of amorphous Indium–Gallium–Zinc Oxide (a-IGZO) films prepared under various deposition pressures, O2/(Ar+O2) flow ratios, and annealing temperatures. X-ray reflectivity (XR
Externí odkaz:
https://doaj.org/article/b57bfc71ec9949679ca89538c3c746f4
Autor:
Yuzhi Li, Shiben Hu, Chan Guo, Siting Chen, Jiantai Wang, Shenghan Zou, Zhangxu Pan, Yue Zhou, Linfeng Lan, Zheng Gong
Publikováno v:
IEEE Electron Device Letters. 44:84-87
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8567c664130b074494250f9adec72999
https://doi.org/10.1109/led.2022.3224920
https://doi.org/10.1109/led.2022.3224920
Autor:
Changhao Li, Zhangxu Pan, Chan Guo, Yuzhi Li, Yue Zhou, Jiantai Wang, Shenghan Zou, Zheng Gong
Publikováno v:
IEEE Transactions on Electron Devices. 69:5630-5636
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a86b63a401e8787c237319b64231fb1a
https://doi.org/10.1109/ted.2022.3202152
https://doi.org/10.1109/ted.2022.3202152
Publikováno v:
IEEE Transactions on Industrial Informatics. 18:6887-6894
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48146cbcb3bcb033286214980b3ac4ee
https://doi.org/10.1109/tii.2022.3141416
https://doi.org/10.1109/tii.2022.3141416
Publikováno v:
2022 Global Reliability and Prognostics and Health Management (PHM-Yantai).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc576b0896a6cce41d50369f0448cc19
https://doi.org/10.1109/phm-yantai55411.2022.9942072
https://doi.org/10.1109/phm-yantai55411.2022.9942072
Publikováno v:
Reliability Engineering & System Safety. 232:109064
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::813e556ce0c7de012892f380cca94cdf
https://doi.org/10.1016/j.ress.2022.109064
https://doi.org/10.1016/j.ress.2022.109064
Publikováno v:
2022 5th International Symposium on Autonomous Systems (ISAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e97c5a657b34fd899256ec53c6036f3a
https://doi.org/10.1109/isas55863.2022.9757330
https://doi.org/10.1109/isas55863.2022.9757330